Equipment List: Difference between revisions
		
		
		
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'''NOTE: For EQUIPMENT TRAINING, contact the tool owner via Email for scheduling - DO NOT USE Labrunr - Training Sessions.'''  | |||
== Lithography ==  | == Lithography ==  | ||
===== Electron Beam Lithography =====  | ===== Electron Beam Lithography =====  | ||
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* [[Contact Mask Aligners: MA6 & MA6/BA6 | Contact Mask Aligners: Suss MicroTec models MA6 & MA6/BA6]]  | * [[Contact Mask Aligners: MA6 & MA6/BA6 | Contact Mask Aligners: Suss MicroTec models MA6 & MA6/BA6]]  | ||
* [[Wafer Stepper | i-Line Wafer Stepper: GCA model 6300]]  | * [[Wafer Stepper | i-Line Wafer Stepper: GCA model 6300]]  | ||
* [[CNI-PV 2.1: Nano Imprint Lithography | Nano Imprint Lithography: NILT CNI-PV 2.1]]  | |||
* [[DWL-66: Direct-Write Laser System | Direct-Write Laser System: Heidelberg Instruments DWL-66]]  | * [[DWL-66: Direct-Write Laser System | Direct-Write Laser System: Heidelberg Instruments DWL-66]]  | ||
* [[Nanoscribe PPGT: Microscale 3D Printer | Two-Photon Lithography (aka Microscale 3D Printing): Nanoscribe Photonic Professional GT]]  | * [[Nanoscribe PPGT: Microscale 3D Printer | Two-Photon Lithography (aka Microscale 3D Printing): Nanoscribe Photonic Professional GT]]  | ||
* [[Optical Lithography Resources]]  | * [[Optical Lithography Resources]]  | ||
== Deposition ==  | == Deposition ==  | ||
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== Microscopy ==  | == Microscopy ==  | ||
===== KNI Microscopy Policies =====  | |||
* [https://caltech.box.com/s/mpsxkxmf5y8wjw9daijwbudeoqkkeudu KNI Microscopy Policies]  | |||
===== Guide to Choosing KNI SEMs & FIBs =====  | ===== Guide to Choosing KNI SEMs & FIBs =====  | ||
*[[Guide to Choosing KNI SEMs & FIBs | Consult this guide for help in choosing the best SEMs and FIBs for your work]]  | *[[Guide to Choosing KNI SEMs & FIBs | Consult this guide for help in choosing the best SEMs and FIBs for your work]]  | ||
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* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe | SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab]]  | * [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe | SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab]]  | ||
===== Scanning Electron Microscopes (SEMs) =====  | ===== Scanning Electron Microscopes (SEMs) =====  | ||
* [[Nova 200 NanoLab: SEM, EDS & WDS | SEM  | * [[Nova 200 NanoLab: SEM, EDS & WDS | SEM & EDS: Thermo Fisher Nova 200 NanoLab]]  | ||
* [[Sirion: SEM & EDS | SEM & EDS: Thermo Fisher Sirion]]  | * [[Sirion: SEM & EDS | SEM & EDS: Thermo Fisher Sirion]]  | ||
* [[Quanta 200F: SEM, ESEM, Lithography & Probe Station | SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F]]  | * [[Quanta 200F: SEM, ESEM, Lithography & Probe Station | SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F]]  | ||
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab]]  | * [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab]]  | ||
===== Transmission Electron Microscopes (TEMs) =====  | ===== Transmission Electron Microscopes (TEMs) =====  | ||
* [[Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF | TEM, STEM, EDS & HAADF: Thermo Fisher Tecnai TF-30 (50-300 kV)]]  | * [[Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF | TEM, STEM, EDS & HAADF: Thermo Fisher Tecnai TF-30 (50-300 kV)]]  | ||
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== Wet Chemistry ==  | == Wet Chemistry ==  | ||
* [[Wet Chemistry | Wet Chemistry Facilities,   | ===== Wet Chemistry Main page=====  | ||
* [[Wet Chemistry | Wet Chemistry page:]] - Facilities, Procedures & Safety, Chemical Lists  | |||
===== Wet Chemistry Safety page=====  | |||
* [[Wet Chemistry Safety | Wet Chemistry Safety page]] - Requesting new chemical, PPE Overview, Hazardous Waste Handling and Labeling, Decanting Chemicals, Hot Plate Rules, Buddy System, Secondary Containment and Other Best Practices.  | |||
===== Wet Chemistry Resources page=====  | |||
* [[Wet Chemistry Resources | Wet Chemistry Resources page]] - Contains fabrication recipes and procedures.  | |||
== Support Tools ==  | == Support Tools ==  | ||
===== Laboratory Data =====  | |||
* [https://caltech.box.com/s/cl3ujgau2afl45joem7mg15e0oyxcgab General Laboratory Pass-down status information]  | |||
===== Thermal Processing =====  | ===== Thermal Processing =====  | ||
* [[Tube Furnaces for Wet & Dry Processing | Tube Furnaces: Tystar Tytan 1 & 2 (Wet & Dry Oxidation and Annealing)]]  | * [[Tube Furnaces for Wet & Dry Processing | Tube Furnaces: Tystar Tytan 1 & 2 (Wet & Dry Oxidation and Annealing)]]  | ||
Revision as of 01:19, 12 October 2021
NOTE: For EQUIPMENT TRAINING, contact the tool owner via Email for scheduling - DO NOT USE Labrunr - Training Sessions.
Lithography
Electron Beam Lithography
- Electron Beam Pattern Generator: Raith EBPG 5200 (100 kV)
 - Electron Beam Pattern Generator: Raith EBPG 5000+ (100 kV)
 - Nanometer Pattern Generation System: Thermo Fisher Quanta 200F SEM with NPGS (1-30 kV)
 - Nanometer Pattern Generation System: Thermo Fisher Tecnai TF-20 S/TEM with NPGS (80-200 kV)
 
Ion Beam Lithography
Optical Lithography
- Contact Mask Aligners: Suss MicroTec models MA6 & MA6/BA6
 - i-Line Wafer Stepper: GCA model 6300
 - Nano Imprint Lithography: NILT CNI-PV 2.1
 - Direct-Write Laser System: Heidelberg Instruments DWL-66
 - Two-Photon Lithography (aka Microscale 3D Printing): Nanoscribe Photonic Professional GT
 - Optical Lithography Resources
 
Deposition
Evaporation
- Metals (Al, Au, Pt & Ti): Kurt J Lesker Labline Electron Beam Evaporator
 - Metals & Oxides: CHA Industries Mark 40 Electron Beam Evaporator
 - Carbon: Leica EM ACE600 Carbon Evaporator
 
Sputtering
- Dielectric Sputter System: AJA International ATC Orion 8
 - Chalcogenide Sputter System: AJA International ATC Orion 8
 
Chemical Vapor Deposition (CVD)
- Atomic Layer Deposition (ALD): Oxford Instruments FlexAL II
 - Plasma-Enhanced Chemical Vapor Deposition (PECVD): Oxford Instruments System 100
 
Dielectric Packaging / Moisture Barrier
Etching
Dry Etching
- Silicon Etcher: Oxford Instruments DRIE System 100 Bosch & Cryo ICP-RIE
 - III-V Material, Metal & Silicon Etcher: Oxford Instruments System 100 ICP-RIE
 - Dielectric Material Etcher: Oxford Instruments Dielectric System 100 ICP-RIE
 - Silicon, III-V Material & Organics Etcher: Plasma-Therm Dual Chamber RIE
 - Oxygen & Argon Plasma Cleaner: PIE Scientific Tergeo Plus ICP- & CCP-RIE
 - XeF2 Etcher for Silicon
 
Wet Etching
Microscopy
KNI Microscopy Policies
Guide to Choosing KNI SEMs & FIBs
Focused Ion Beam (FIB) Systems
- Helium, Neon & Gallium FIB: Zeiss ORION NanoFab
 - SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab
 
Scanning Electron Microscopes (SEMs)
- SEM & EDS: Thermo Fisher Nova 200 NanoLab
 - SEM & EDS: Thermo Fisher Sirion
 - SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F
 - SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab
 
Transmission Electron Microscopes (TEMs)
- TEM, STEM, EDS & HAADF: Thermo Fisher Tecnai TF-30 (50-300 kV)
 - TEM, STEM, EDS, EELS, EFTEM & Lithography: Thermo Fisher Tecnai TF-20 (40-200 kV)
 
Scanning Probe Microscopes
Optical Characterization
- Spectroscopic Ellipsometer: Woolam M-2000
 - Light Microscope: Olympus BX51M with Filmetrics Spectroscopic Reflectometer
 - Fluorescence Microscope: Olympus IX81
 
Sample Preparation for Microscopy
- Carbon Evaporator (Leica EM ACE600) to make samples conductive
 - Oxygen & Argon Plasma Cleaner (Tergeo Plus ICP- & CCP-RIE) to remove hydrocarbons from surface
 - TEM Sample Preparation Equipment: Polishing Stations, 3 mm Disk Cutter, Dimpler, Argon Ion Mill
 
Wet Chemistry
Wet Chemistry Main page
- Wet Chemistry page: - Facilities, Procedures & Safety, Chemical Lists
 
Wet Chemistry Safety page
- Wet Chemistry Safety page - Requesting new chemical, PPE Overview, Hazardous Waste Handling and Labeling, Decanting Chemicals, Hot Plate Rules, Buddy System, Secondary Containment and Other Best Practices.
 
Wet Chemistry Resources page
- Wet Chemistry Resources page - Contains fabrication recipes and procedures.
 
Support Tools
Laboratory Data
Thermal Processing
- Tube Furnaces: Tystar Tytan 1 & 2 (Wet & Dry Oxidation and Annealing)
 - Rapid Thermal Processing: Modular Process Technology RTP-600S
 
Substrate Processing
- Scriber-Breaker: Dynatex GST-150
 - Wafer Bonder: Suss MicroTec model SB6L
 - Critical Point Dryer: Tousimis Automegasamdri 915B
 
Device Processing
Metrology
- Spectroscopic Ellipsometer: Woolam M-2000
 - Profilometer: Veeco Dektak 3ST
 - Light Microscope: Olympus BX51M with Filmetrics Spectroscopic Reflectometer
 - Electrical Probing Station: Cascade Microtech M150