Difference between revisions of "Equipment List"

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== Microscopy ==
 
== Microscopy ==
 +
===== Guide to Choosing KNI SEMs & FIBs =====
 +
*[[Guide to Choosing KNI SEMs & FIBs | Consult this guide for help in choosing the right SEMs and FIBs]]
 
===== Focused Ion Beam (FIB) Systems =====
 
===== Focused Ion Beam (FIB) Systems =====
 
* [[ORION NanoFab: Helium, Neon & Gallium FIB | Helium, Neon & Gallium FIB: Zeiss ORION NanoFab]]
 
* [[ORION NanoFab: Helium, Neon & Gallium FIB | Helium, Neon & Gallium FIB: Zeiss ORION NanoFab]]

Revision as of 05:11, 21 October 2019

Lithography

Electron Beam Lithography
Ion Beam Lithography
Optical Lithography

Deposition

Evaporation
Sputtering
Chemical Vapor Deposition (CVD)
Dielectric Packaging / Moisture Barrier

Etching

Dry Etching
Wet Etching

Microscopy

Guide to Choosing KNI SEMs & FIBs
Focused Ion Beam (FIB) Systems
Scanning Electron Microscopes (SEMs)
Transmission Electron Microscopes (TEMs)
Scanning Probe Microscopes
Optical Characterization
Sample Preparation for Microscopy

Wet Chemistry

Support Tools

Thermal Processing
Substrate Processing
Device Processing
Metrology
Sample Preparation