Difference between revisions of "Equipment List"

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===== Optical Characterization =====
 
===== Optical Characterization =====
 +
* [[Spectroscopic Ellipsometer | Spectroscopic Ellipsometer: Woolam M-2000]]
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* [[Light Microscope with Spectroscopic Reflectometer | Light Microscope: Olympus BX51M with Filmetrics Spectroscopic Reflectometer]]
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* [[Fluorescence Microscope | Fluorescence Microscope: Olympus IX81]]
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*
 
* [[Woolam M-2000: Spectroscopic Ellipsometer | Spectroscopic Ellipsometry: Woolam M-2000]]
 
* [[Woolam M-2000: Spectroscopic Ellipsometer | Spectroscopic Ellipsometry: Woolam M-2000]]
 
* [[Olympus BX51M with Filmetrics F40: Light Microscope | Light Microscope: Olympus BX51M with Filmetrics model F40]]
 
* [[Olympus BX51M with Filmetrics F40: Light Microscope | Light Microscope: Olympus BX51M with Filmetrics model F40]]
 
* [[Olympus IX81: Fluorescence Microscope | Fluorescence Microscope: Olympus IX81]]
 
* [[Olympus IX81: Fluorescence Microscope | Fluorescence Microscope: Olympus IX81]]
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===== Sample Preparation for Microscopy =====
 
===== Sample Preparation for Microscopy =====
 
* [[Leica EM ACE600: Carbon Evaporator | Carbon Evaporator (Leica EM ACE600) to make samples conductive]]
 
* [[Leica EM ACE600: Carbon Evaporator | Carbon Evaporator (Leica EM ACE600) to make samples conductive]]

Revision as of 00:45, 22 May 2019

Lithography

Electron Beam Lithography
Ion Beam Lithography
Optical Lithography

Deposition

Evaporation
Sputtering
Chemical Vapor Deposition (CVD)
Dielectric Packaging / Moisture Barrier

Etching

Dry Etching
Wet Etching

Microscopy

Focused Ion Beam (FIB) Systems
Scanning Electron Microscopes (SEMs)
Transmission Electron Microscopes (TEMs)
Scanning Probe Microscopes
Optical Characterization
Sample Preparation for Microscopy

Support Tools

Thermal Processing
Substrate Processing
Device Processing
Sample Preparation

Old Support Tools (Do not edit these)

Thermal Processing
Substrate Processing
Device Processing
Sample Preparation