Wafer Stepper: Difference between revisions

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|RoomLocation = B217 Steele
|RoomLocation = B217 Steele
|LabPhone = 626-395-1536
|LabPhone = 626-395-1536
|PrimaryStaff = [[Bert Mendoza]]
|PrimaryStaff = [[Guy DeRose]]
|StaffEmail = bertm@caltech.edu
|StaffEmail = derose@caltech.edu
|StaffPhone = 626-395-4075
|StaffPhone = 626-395-3423
|Manufacturer = GCA
|Manufacturer = GCA
|Model = 6300
|Model = 6300
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* System is setup for 4 inch wafers and pieces smaller than 100mm.
* System is setup for 4 inch wafers and pieces smaller than 100mm.


=== Labrunr Reservation Rules:===
=== FBS Reservation Rules:===
{| class="wikitable"
{| class="wikitable"
|-
|-
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=== Optical Lithography Resources ===
=== Optical Lithography Resources ===
* [[Optical Lithography Resources | Optical Lithography Resources Page]]
* [[Optical Lithography Resources | Optical Lithography Resources Page]]
===== Equipment Status =====
* [https://labrunr.caltech.edu/Equipment_2.aspx LabRunr Equipment Status] (Select Stepper from the dropdown menu)


== Related Instrumentation in the KNI ==
== Related Instrumentation in the KNI ==

Latest revision as of 19:12, 29 June 2024

Stepper
I-Line-Wafer-Stepper GCA-6300.jpg
Instrument Type Lithography
Techniques Wafer Patterning,
Pattern Alignments
Staff Manager Guy DeRose
Staff Email derose@caltech.edu
Staff Phone 626-395-3423
Reserve time on FBS
Request training via FBS User Dashboard
Lab Location B217 Steele
Lab Phone 626-395-1536
Manufacturer GCA
Model 6300

Description

The 6000 Series DSW Wafer Stepper wafer exposure system is fully automatic and capable of exposing an array of images directly on photoresist-coated wafers. Image field size is dependent on the lens selected for the user's particular application. The lens in this system is a Zeiss 10X with a maximum field size of 10 mm x 10 mm. This reduces the pattern from the reticle by a factor of 10 onto the substrate. The KNI stepper has paddles for wafer handling to accommodate 2-, 3-, 4-, 6-, and 8-inch wafers as well as pieces. The stepper is located inside of an environmental chamber set to maintain +/-0.1 °C temperature control.

Software allows conversational input dialogue to reduce errors and simplify the specification of complex operating parameters, a part of which permits selection of either circular of rectangular arrays on the wafer. A laser position transducer with automatic compensation for atmospheric conditions and work piece temperature is employed to meter X- & Y-coordinate stage positioning over a 150 mm x 150 mm (6 in x 6 in) square exposable area. Maximum throughput is assured through use of X- & Y-coordinate stage speeds of up to 50 mm (2 in) per second and exposures in both directions of travel (boustrophedonic stepping). The GCA 6300 at KNI has been fully refurbished by RZE Enterprises with a new PC and control electronics.

Applications
  • Step exposure with alignments
  • Step exposure without alignments

Resources

Specifications

  • Spectral Line: 365 nm wavelength (aka "i-line") via Hg lamp
  • System is setup for 4 inch wafers and pieces smaller than 100mm.

FBS Reservation Rules:

Advanced Res (days) Limit per Res (hrs) Limit per week (hrs)
Weekday 7 4 12
Weeknight 7 6 18
Weekend 14 6 18

For reservations that DO NOT follow the reservation policy, email the tool manager BEFORE scheduling. Your reservation can be cancelled at any time by the tool manager if it does not follow the tool reservation policy.

SOPs

Manufacturer Manuals 

Optical Lithography Resources

Related Instrumentation in the KNI

Optical Lithography
Electron Beam Lithography
Ion Beam Lithography