Difference between revisions of "Plasma-Enhanced Chemical Vapor Deposition (PECVD)"
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|RoomLocation = B235 Steele | |RoomLocation = B235 Steele | ||
|LabPhone = 626-395-1532 | |LabPhone = 626-395-1532 | ||
|PrimaryStaff = [[ | |PrimaryStaff = [[Kelly McKenzie]] | ||
|StaffEmail = | |StaffEmail = kmmckenz@caltech.edu | ||
|StaffPhone = 626-395- | |StaffPhone = 626-395-5732 | ||
|Manufacturer = Oxford Instruments | |Manufacturer = Oxford Instruments | ||
|Model = Plasmalab System 100 | |Model = Plasmalab System 100 | ||
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* Hard masks compatible with process temperature | * Hard masks compatible with process temperature | ||
===== PECVD Gas List ===== | ===== PECVD Gas List ===== | ||
* SiH<sub>4</sub> | * 5% SiH<sub>4</sub> in N<sub>2</sub> | ||
* 5% SiH<sub>4</sub> in Ar | |||
* NH<sub>3</sub> | * NH<sub>3</sub> | ||
* N<sub>2</sub>O | * N<sub>2</sub>O | ||
* N<sub>2</sub> | * N<sub>2</sub> | ||
* | * Mixture of CF<sub>4</sub> and O<sub>2</sub> (4:1) for Plasma Clean | ||
== Resources == | == Resources == | ||
===== Equipment Status ===== | |||
* [https://labrunr.caltech.edu/Equipment_2.aspx LabRunr Equipment Status] (Select Oxford_PECVD from the dropdown menu) | |||
===== SOPs & Troubleshooting ===== | ===== SOPs & Troubleshooting ===== | ||
* [https://caltech.box.com/s/c8qx3ikzjb05x44o4updpqs36ra39ytw KNI SOP] | * [https://caltech.box.com/s/c8qx3ikzjb05x44o4updpqs36ra39ytw KNI SOP] | ||
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* [https://caltech.box.com/s/29e5taof6r80d45lfb4sgbup1k6rebpx Gas Status Board SOP] | * [https://caltech.box.com/s/29e5taof6r80d45lfb4sgbup1k6rebpx Gas Status Board SOP] | ||
===== Process Documents ===== | ===== Process Documents ===== | ||
* [https://caltech.box.com/s/qnxzioeoudzbnow9aopguf9xkysxsey3 KNI's Amorphous Silicon recipe] | |||
* [https://caltech.box.com/s/gy10uau7tikhvhakgpjvlzalb7boavbv KNI's 350C SiO2 recipe] | |||
* [https://caltech.box.com/s/0e14n82o7o9yziqmlygkakfcv1lp65iu Process Standards] | * [https://caltech.box.com/s/0e14n82o7o9yziqmlygkakfcv1lp65iu Process Standards] | ||
* [https://caltech.box.com/s/6b2ivuuguflqjaqby5werlcslmmudryf High rate SiOx] | * [https://caltech.box.com/s/6b2ivuuguflqjaqby5werlcslmmudryf High rate SiOx] | ||
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* [https://caltech.box.com/s/tc4j0yr2jazv0rd6ey22ri8jd1asl326 Low Rate SiOx] | * [https://caltech.box.com/s/tc4j0yr2jazv0rd6ey22ri8jd1asl326 Low Rate SiOx] | ||
* [https://caltech.box.com/s/r3socf5rslp7qs9rb5o7vvpyp12qf0ps Low rate SiNx] | * [https://caltech.box.com/s/r3socf5rslp7qs9rb5o7vvpyp12qf0ps Low rate SiNx] | ||
* [https://caltech.box.com/s/6acyh95hslt0q711makbllgqjrexpew1 Amorphous Silicon Deposition (Silane/helium)] | * [https://caltech.box.com/s/6acyh95hslt0q711makbllgqjrexpew1 Amorphous Silicon Deposition (Silane/helium)] | ||
* [https://caltech.box.com/s/ymt2wqtkkjwcyw5c71f2adm2a1u041zn Etch chamber cleaning recipes] | * [https://caltech.box.com/s/ymt2wqtkkjwcyw5c71f2adm2a1u041zn Etch chamber cleaning recipes] | ||
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* 5 Torr capacitance manometer for process control, and penning for base pressure measurement | * 5 Torr capacitance manometer for process control, and penning for base pressure measurement | ||
* Process chamber pumping with 63 mm branch to APC, and isolation valve; chamber base pressure turbo, backed by a refurbished dry pump with roots | * Process chamber pumping with 63 mm branch to APC, and isolation valve; chamber base pressure turbo, backed by a refurbished dry pump with roots | ||
* Twelve line gas pod with two non-toxic and | * Twelve line gas pod with two non-toxic and three toxic digital mass-flow-controlled gas lines and cleaning gas | ||
* Chamber Gas ring, with split gas manifold | * Chamber Gas ring, with split gas manifold | ||
* Liquid vapor delivery system | * Liquid vapor delivery system |
Revision as of 05:29, 30 June 2022
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Description
The Plasma-Enhanced Chemical Vapor Deposition (PECVD) system is an Oxford Instruments Plasma Technology Plasmalab System 100 platform that is optimized for amorphous silicon, silicon dioxide, and silicon nitride deposition. The PECVD has a variable temperature stage (RT to 600 °C). This system supports wafer sizes up to 6 inches, and provides PECVD film growth over a wide range of process conditions.
Applications
- Amorphous Silicon Deposition
- Silicon Dioxide Deposition
- Silicon Nitride Deposition
Allowed material in PECVD System
- Si, SixNy, SiO2, SOI
- Hard masks compatible with process temperature
PECVD Gas List
- 5% SiH4 in N2
- 5% SiH4 in Ar
- NH3
- N2O
- N2
- Mixture of CF4 and O2 (4:1) for Plasma Clean
Resources
Equipment Status
- LabRunr Equipment Status (Select Oxford_PECVD from the dropdown menu)
SOPs & Troubleshooting
Process Documents
- KNI's Amorphous Silicon recipe
- KNI's 350C SiO2 recipe
- Process Standards
- High rate SiOx
- High rate SiNx
- Low Rate SiOx
- Low rate SiNx
- Amorphous Silicon Deposition (Silane/helium)
- Etch chamber cleaning recipes
Manufacturer Manuals
Specifications
Manufacturer Specifications
System Features
- Universal base console that houses the electronic sub systems, control units, pneumatics, and turbomolecular pump
- PC 2000 Operating system
- PECVD process chamber with 160 mm pumping port, view port, and an additional rear port for optical emission end-point-detection
- Heated upper electrode to prevent condensation of low vapor pressure precursors
- PECVD 205 mm electrically heated (700 °C) lower electrode with central wafer lift mechanism
- Parameter ramping software
- 5 Torr capacitance manometer for process control, and penning for base pressure measurement
- Process chamber pumping with 63 mm branch to APC, and isolation valve; chamber base pressure turbo, backed by a refurbished dry pump with roots
- Twelve line gas pod with two non-toxic and three toxic digital mass-flow-controlled gas lines and cleaning gas
- Chamber Gas ring, with split gas manifold
- Liquid vapor delivery system
- Single-wafer automatic insertion load lock with soft pump option
System Specifications
- Chamber wall heating 80 °C
- 30/300 W RF generator close-coupled to the upper electrode through an automatic matching unit; the generator is configured to operate in a low-power mode (0-30 W) for higher accuracy during low-rate deposition processes
- 600 W solid-state 50-460 kHz LF generator