Digital Microscope Keyence VHX7000: Difference between revisions
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{{InstrumentInfoboxOneImage| | {{InstrumentInfoboxOneImage| | ||
|InstrumentName = | |InstrumentName = Keyence VHX-7000 | ||
|HeaderColor = #FFFFFF | |HeaderColor = #FFFFFF | ||
|ImageOne = | |ImageOne = Keyence VHX-7000.jpg | ||
| | |InstrumentType = [[Equipment_List#Metrology|Metrology]],<br>[[Equipment_List#Optical Characterization|Optical Characterization]] | ||
| | |||
|RoomLocation = B217 Steele | |RoomLocation = B217 Steele | ||
|LabPhone = 626-395-1535 | |LabPhone = 626-395-1535 | ||
|PrimaryStaff = | |PrimaryStaff = Alex Wertheim | ||
|StaffEmail = | |StaffEmail = alexw@caltech.edu | ||
|StaffPhone = 626-395- | |StaffPhone = 626-395-4075 | ||
|Manufacturer = | |Manufacturer = Keyence Corporation | ||
|Model = | |Model = VHX-7000 | ||
|Techniques = | |Techniques = 2D/3D measurements<br>Digital Camera</br>High Magnification Inspection | ||
}} | }} | ||
== Description == | == Description == | ||
[[Image: | [[Image:Keyence VHX-7000 closeup.jpg|thumb|upright=1.12|Keyence Corporation model VHX-7000]] | ||
The Keyence VHX Series 4K Digital Microscope uses high-resolution 4K imaging and advanced analysis software for high-magnification imaging, 2D/3D measurements, and more. The VHX Series has a depth of field that is 20 times greater than conventional optical microscopes. 2D and 3D measurements for roughness, contamination, grain size, and other measurements can be performed. The digital images can be saved in their original form or with measurements applied. | The Keyence VHX Series 4K Digital Microscope uses high-resolution 4K imaging and advanced analysis software for high-magnification imaging, 2D/3D measurements, and more. The VHX Series has a depth of field that is 20 times greater than conventional optical microscopes. 2D and 3D measurements for roughness, contamination, grain size, and other measurements can be performed. The digital images can be saved in their original form or with measurements applied. | ||
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* coming soon | * coming soon | ||
=== Manufacturer Manuals === | === Manufacturer Manuals === | ||
* | * [https://caltech.box.com/s/xoegl6wje7foaq65osiqei1bzwbwgwhv Keyence VHX-7000 Manual] | ||
== Related Instrumentation in the KNI == | == Related Instrumentation in the KNI == | ||
=== Metrology === | |||
* [[Dektak 3ST: Profilometer | Profilometer: Veeco Dektak 3ST]] | |||
* [[Electrical Probing Station | Electrical Probing Station: Cascade Microtech M150]] | |||
* [[Spectroscopic Ellipsometer | Spectroscopic Ellipsometer: Woolam M-2000]] | |||
* [[Light Microscope with Spectroscopic Reflectometer | Light Microscope: Olympus BX51M with Filmetrics Spectroscopic Reflectometer]] | |||
* Light Microscope Nikon L200 / Nikon Camera - [https://caltech.box.com/s/3sxmh6pt073a7qgpohgzjdl53acmr2ho Nikon L200/L200D Manual], [https://caltech.box.com/s/4fmfx7mazcdpjy0edqbgi4e1jbb7azdy Nikon L200 Operation Quick Reference] | |||
=== Optical Characterization === | === Optical Characterization === | ||
* [[Fluorescence Microscope | Fluorescence Microscope: Olympus IX81]] | * [[Fluorescence Microscope | Fluorescence Microscope: Olympus IX81]] | ||
* [[Light Microscope with Spectroscopic Reflectometer | Light Microscope: Olympus BX51M with Filmetrics Spectroscopic Reflectometer]] | * [[Light Microscope with Spectroscopic Reflectometer | Light Microscope: Olympus BX51M with Filmetrics Spectroscopic Reflectometer]] | ||
* [[Spectroscopic Ellipsometer | Spectroscopic Ellipsometer: Woolam M-2000]] | * [[Spectroscopic Ellipsometer | Spectroscopic Ellipsometer: Woolam M-2000]] | ||
=== Scanning Electron Microscopes (SEMs) === | |||
* [[Nova 200 NanoLab: SEM & EDS | Nova 200 NanoLab: SEM & EDS]] | |||
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab]] | |||
* [[Quanta 200F: SEM, ESEM, Lithography & Probe Station | SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F]] | |||
* [[Sirion: SEM & EDS | Sirion: SEM & EDS]] | |||
=== Scanning Probe Microscopes === | |||
* [[Dimension Icon: Atomic Force Microscope (AFM) | Atomic Force Microscope (AFM): Bruker Dimension Icon]] | |||
Latest revision as of 19:20, 18 December 2023
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Description
The Keyence VHX Series 4K Digital Microscope uses high-resolution 4K imaging and advanced analysis software for high-magnification imaging, 2D/3D measurements, and more. The VHX Series has a depth of field that is 20 times greater than conventional optical microscopes. 2D and 3D measurements for roughness, contamination, grain size, and other measurements can be performed. The digital images can be saved in their original form or with measurements applied.
Objectives Available
- Low Magnification Lens = 20-100x
- Medium Magnification Lens = 100-500x
- High Magnification Lens = 500-2500x
- Highest Magnification Lens = 2500-6000x
Resources
SOPs & Troubleshooting
- coming soon
Manufacturer Manuals
Related Instrumentation in the KNI
Metrology
- Profilometer: Veeco Dektak 3ST
- Electrical Probing Station: Cascade Microtech M150
- Spectroscopic Ellipsometer: Woolam M-2000
- Light Microscope: Olympus BX51M with Filmetrics Spectroscopic Reflectometer
- Light Microscope Nikon L200 / Nikon Camera - Nikon L200/L200D Manual, Nikon L200 Operation Quick Reference
Optical Characterization
- Fluorescence Microscope: Olympus IX81
- Light Microscope: Olympus BX51M with Filmetrics Spectroscopic Reflectometer
- Spectroscopic Ellipsometer: Woolam M-2000
Scanning Electron Microscopes (SEMs)
- Nova 200 NanoLab: SEM & EDS
- SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab
- SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F
- Sirion: SEM & EDS