Oxide/Nitride Deposition: Oxford Instruments PlasmaPro System 100 PECVD: Difference between revisions
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Created page with "{{InstrumentInfoboxOneImage| |InstrumentName = PECVD |HeaderColor = #F2682A |ImageOne = PECVD_Oxford-System-100.jpg |ImageTwo = |InstrumentType = Deposition |RoomLocation = B235 Steele |LabPhone = 626-395-1532 |PrimaryStaff = Kelly McKenzie |StaffEmail = kmmckenz@caltech.edu |StaffPhone = 626-395-5732 |Manufacturer = Oxford Instruments |Model = PlasmaPro System 100 |Techniques = Amorphous Silicon Deposition,<br>Silicon Dioxide Depositio..." |
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== Description == | == Description == | ||
The Plasma-Enhanced Chemical Vapor Deposition (PECVD) system is an Oxford Instruments Plasma Technology | The Plasma-Enhanced Chemical Vapor Deposition (PECVD) system is an Oxford Instruments Plasma Technology PlasmaPro System 100 platform that is optimized for silicon dioxide and silicon nitride deposition. The PECVD has a variable temperature stage (RT to 600 °C). This system supports wafer sizes up to 6 inches, and provides PECVD film growth over a wide range of process conditions. | ||
===== Applications ===== | ===== Applications ===== | ||
* Silicon Dioxide Deposition | * Silicon Dioxide Deposition | ||
* Silicon Nitride Deposition | * Silicon Nitride Deposition | ||
| Line 25: | Line 24: | ||
* Si, Si<sub>x</sub>N<sub>y</sub>, SiO<sub>2</sub>, SOI | * Si, Si<sub>x</sub>N<sub>y</sub>, SiO<sub>2</sub>, SOI | ||
* Hard masks compatible with process temperature | * Hard masks compatible with process temperature | ||
* Other materials buried in stack | |||
===== PECVD Gas List ===== | ===== PECVD Gas List ===== | ||
* 5% SiH<sub>4</sub> in N<sub>2</sub> | * 5% SiH<sub>4</sub> in N<sub>2</sub> | ||
| Line 31: | Line 31: | ||
* N<sub>2</sub>O | * N<sub>2</sub>O | ||
* N<sub>2</sub> | * N<sub>2</sub> | ||
* | * CF4 (for plasma clean) | ||
== Resources == | == Resources == | ||
| Line 42: | Line 42: | ||
===== Process Documents ===== | ===== Process Documents ===== | ||
* [https://caltech.box.com/s/gy10uau7tikhvhakgpjvlzalb7boavbv KNI's 350C SiO2 recipe] | * [https://caltech.box.com/s/gy10uau7tikhvhakgpjvlzalb7boavbv KNI's 350C SiO2 recipe] | ||
* [https://caltech.box.com/s/0e14n82o7o9yziqmlygkakfcv1lp65iu Process Standards] | * [https://caltech.box.com/s/0e14n82o7o9yziqmlygkakfcv1lp65iu Process Standards] | ||
| Line 49: | Line 48: | ||
* [https://caltech.box.com/s/tc4j0yr2jazv0rd6ey22ri8jd1asl326 Low Rate SiOx] | * [https://caltech.box.com/s/tc4j0yr2jazv0rd6ey22ri8jd1asl326 Low Rate SiOx] | ||
* [https://caltech.box.com/s/r3socf5rslp7qs9rb5o7vvpyp12qf0ps Low rate SiNx] | * [https://caltech.box.com/s/r3socf5rslp7qs9rb5o7vvpyp12qf0ps Low rate SiNx] | ||
* [https://caltech.box.com/s/ymt2wqtkkjwcyw5c71f2adm2a1u041zn Etch chamber cleaning recipes] | * [https://caltech.box.com/s/ymt2wqtkkjwcyw5c71f2adm2a1u041zn Etch chamber cleaning recipes] | ||
Revision as of 19:18, 21 October 2026
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Description
The Plasma-Enhanced Chemical Vapor Deposition (PECVD) system is an Oxford Instruments Plasma Technology PlasmaPro System 100 platform that is optimized for silicon dioxide and silicon nitride deposition. The PECVD has a variable temperature stage (RT to 600 °C). This system supports wafer sizes up to 6 inches, and provides PECVD film growth over a wide range of process conditions.
Applications
- Silicon Dioxide Deposition
- Silicon Nitride Deposition
Allowed material in PECVD System
- Si, SixNy, SiO2, SOI
- Hard masks compatible with process temperature
- Other materials buried in stack
PECVD Gas List
- 5% SiH4 in N2
- 5% SiH4 in Ar
- NH3
- N2O
- N2
- CF4 (for plasma clean)
Resources
SOPs & Troubleshooting
- KNI SOP
- Oxfords reservation and use policy
- Etcher toxic gas handling SOP
- Power Up Oxford ICP-RIE SOP
- Gas Status Board SOP
Process Documents
- KNI's 350C SiO2 recipe
- Process Standards
- High rate SiOx
- High rate SiNx
- Low Rate SiOx
- Low rate SiNx
- Etch chamber cleaning recipes
Manufacturer Manuals
Specifications
Manufacturer Specifications
System Features
- Universal base console that houses the electronic sub systems, control units, pneumatics, and turbomolecular pump
- PC 2000 Operating system
- PECVD process chamber with 160 mm pumping port, view port, and an additional rear port for optical emission end-point-detection
- Heated upper electrode to prevent condensation of low vapor pressure precursors
- PECVD 205 mm electrically heated (700 °C) lower electrode with central wafer lift mechanism
- Parameter ramping software
- 5 Torr capacitance manometer for process control, and penning for base pressure measurement
- Process chamber pumping with 63 mm branch to APC, and isolation valve; chamber base pressure turbo, backed by a refurbished dry pump with roots
- Twelve line gas pod with two non-toxic and three toxic digital mass-flow-controlled gas lines and cleaning gas
- Chamber Gas ring, with split gas manifold
- Liquid vapor delivery system
- Single-wafer automatic insertion load lock with soft pump option
System Specifications
- Chamber wall heating 80 °C
- 30/300 W RF generator close-coupled to the upper electrode through an automatic matching unit; the generator is configured to operate in a low-power mode (0-30 W) for higher accuracy during low-rate deposition processes
- 600 W solid-state 50-460 kHz LF generator
