Oxide/Nitride Deposition: Oxford Instruments PlasmaPro System 100 PECVD: Difference between revisions
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|InstrumentName = Oxide/Nitride PECVD | |InstrumentName = Oxide/Nitride PECVD | ||
|HeaderColor = #F2682A | |HeaderColor = #F2682A | ||
|ImageOne = | |ImageOne = OxidenitridePECVD.jpg | ||
|ImageTwo = | |ImageTwo = | ||
|InstrumentType = [[Equipment_List#Deposition|Deposition]] | |InstrumentType = [[Equipment_List#Deposition|Deposition]] | ||
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|Manufacturer = Oxford Instruments | |Manufacturer = Oxford Instruments | ||
|Model = PlasmaPro System 100 | |Model = PlasmaPro System 100 | ||
|Techniques = | |Techniques = Silicon Dioxide Deposition,<br>Silicon Nitride Deposition | ||
|EmailList = kni-oxfordpecvd | |EmailList = kni-oxfordpecvd | ||
|EmailListName = Oxford PECVD | |EmailListName = Oxford PECVD | ||
Latest revision as of 16:13, 27 October 2026
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Description
The Plasma-Enhanced Chemical Vapor Deposition (PECVD) system is an Oxford Instruments Plasma Technology PlasmaPro System 100 platform that is optimized for silicon dioxide and silicon nitride deposition. The PECVD has a variable temperature stage (RT to 600 °C). This system supports wafer sizes up to 6 inches, and provides PECVD film growth over a wide range of process conditions.
Applications
- Silicon Dioxide Deposition
- Silicon Nitride Deposition
Allowed material in PECVD System
- Si, SixNy, SiO2, SOI
- Hard masks compatible with process temperature
- Other materials buried in stack
PECVD Gas List
- 5% SiH4 in N2
- 5% SiH4 in Ar
- NH3
- N2O
- N2
- O2
- CF4 (for plasma clean)
Resources
SOPs & Troubleshooting
- KNI SOP
- Oxfords reservation and use policy
- Etcher toxic gas handling SOP
- Power Up Oxford ICP-RIE SOP
- Gas Status Board SOP
Process Documents
Manufacturer Manuals
Specifications
Manufacturer Specifications
System Features
- Process module frame and separate control rack that house the electronic sub systems, control units, pneumatics, and turbomolecular pump
- PTIQ operating system
- PECVD process chamber with 160 mm pumping port, view port, and an additional rear port for optical emission end-point-detection
- Heated upper electrode to prevent condensation of low vapor pressure precursors
- PECVD 205 mm electrically heated (700 °C) lower electrode with central wafer lift mechanism
- Parameter ramping software
- 5 Torr capacitance manometer for process control, and penning for base pressure measurement
- Process chamber pumping with 63 mm branch to APC, and isolation valve; chamber base pressure turbo, backed by a refurbished dry pump with roots
- Twelve line gas pod with two non-toxic and three toxic digital mass-flow-controlled gas lines and cleaning gas
- Chamber Gas ring, with split gas manifold
- Liquid vapor delivery system
- Single-wafer automatic insertion load lock with soft pump option
System Specifications
- Chamber wall heating 80 °C
- 30/300 W RF generator close-coupled to the upper electrode through an automatic matching unit; the generator is configured to operate in a low-power mode (0-30 W) for higher accuracy during low-rate deposition processes
- 600 W solid-state 50-460 kHz LF generator
