Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF

Tecnai TF-30 Instrument Type Microscopy Techniques TEM, STEM, Bright & Dark Field Imaging, EDS, HAADF, Electron Diffraction, Tomography Staff Manager Matthew S. Hunt, PhD Staff Email matthew.hunt@caltech.edu Staff Phone 626-395-5994 Reserve time on LabRunr Request training by email Sign up for TF-30 email list Lab Location B242F Keck Lab Phone 626-395-8908 Manufacturer FEI (now Thermo Fisher) Model Tecnai TF-30

Description

The Tecnai TF-30 is a transmission electron microscope (TEM) that can also be operated in scanning transmission electron microscopy (STEM) mode, with a voltage range of 50 to 300 kV. Operation at 300 kV makes this the KNI's highest resolution TEM (see also the 200 kV Tecnai TF-20, which has more analytical options such as EELS and EFTEM). The TF-30 is also equipped with a high-angle annular dark field (HAADF) detector for use in STEM mode, and an energy dispersive spectroscopy (EDS) detector for compositional analysis (in both TEM mode and, most often, in STEM mode). The Serial EM program allows for automated collection of images at variable tilt angles for performing tomography. See a full list of training and educational resources for this instrument below.

Applications

• High-Resolution TEM (HRTEM) imaging without an objective aperture
• Bright Field (BF) & Dark Field (DF) imaging with an objective aperture
• Selected Area Electron Diffraction (SAED)
• STEM imaging with a High-Angle Annular Dark Field (HAADF) detector
• Energy Dispersive Spectroscopy (EDS) with an Oxford INCA system
• Automatically capture tilt series of images for tomographic imaging

Resources

SOPs & Troubleshooting

• SOP Guide
• Troubleshooting Guide

Manufacturer Resources

• Full manufacturer manual is accessible via the UI under the Help menu

Other Online Resources

• Rodenburg.org's Learn to Use a TEM

Sample Preparation

• Sample preparation is a highly specific task related to each sample type and is therefore primarily the responsibility of the user to carry out.
  • KNI staff can teach users how to create lamellae from a bulk specimen using an SEM/Ga-FIB system (see SOP and YouTube playlist)
  • The KNI also has a TEM sample preparation lab that is primarily used to make cross-section samples by traditional methods (i.e. glue together a stack, cut out 3 mm core, thin by polishing, dimple, then final polish with argon mill); inquire with staff for help with these sample preparation tools

Order Your Own Grids

• Grids used for mounting specimens are considered a personal, consumable item in the KNI. You are required to supply your own grids.

Specifications

Manufacturer Specifications

• TF-30 Product Guide & Specifications

TEM & STEM Specifications

• From FEI’s (now Thermo Fisher’s) Tecnai G² F30 Family
• Voltage Range: 50-300 kV
• Point resolution: 0.20 nm
• Line resolution: 0.10 nm
• STEM resolution: 0.17 nm
• Information limit: 0.14 nm
• Energy spread: 0.7 eV
• Max alpha-tilt angle with double-tilt holder: ±40°
• Max alpha-tilt angle with tomography holder: ±80°
• Maximum diffraction angle: ±12°
• Camera length: 35–2300 mm
• EDS solid angle: 0.13 srad

Related Instrumentation in the KNI

Transmission Electron Microscopes

• Tecnai TF-30: TEM, STEM, EDS & HAADF (50-300 kV)
• Tecnai TF-20: TEM, STEM, EDS, EELS, EFTEM & Lithography (40-200 kV)

Sample Preparation for TEM

• Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe
• TEM Sample Preparation Equipment: Polishing Stations, 3 mm Disk Cutter, Dimpler, Argon Ion Mill

Scanning Electron Microscopes (SEMs)

• Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe
• Nova 200 NanoLab: SEM, EDS & WDS
• Sirion: SEM & EDS
• Quanta 200F: SEM, ESEM, Lithography & Probe Station

Focused Ion Beam (FIB) Systems

• Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe
• ORION NanoFab: Helium, Neon & Gallium FIB

Sample Preparation for Microscopy

• Carbon Evaporator (Leica EM ACE600) to make samples conductive
• Oxygen & Argon Plasma Cleaner (Tergeo Plus ICP- & CCP-RIE) to remove hydrocarbons from surface