Difference between revisions of "Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF"

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== Description ==
== Description ==
[[Image:TF-30-Schematic-KNI-Caltech.jpg|thumb|top|upright=1.00|A schematic of the KNI's Tecnai TF-30 TEM/STEM, with attachments. Modified from an original schematic that is courtesy Portland State University.]]
The Tecnai TF-30 is a transmission electron microscope (TEM) that can also be operated in scanning transmission electron microscopy (STEM) mode, with a voltage range of 50 to 300 kV. Operation at 300 kV makes this the KNI's highest resolution TEM (see also the 200 kV [[Tecnai_TF-20:_200_kV_TEM,_STEM,_EDS,_EELS,_EFTEM_%26_Lithography | Tecnai TF-20]], which has more analytical options such as EELS and EFTEM). The TF-30 is also equipped with a high-angle annular dark field (HAADF) detector for use in STEM mode, and an energy dispersive spectroscopy (EDS) detector for compositional analysis (in both TEM mode and, most often, in STEM mode). The Serial EM program allows for automated collection of images at variable tilt angles for performing tomography. See a full list of training and educational resources for this instrument below.
The Tecnai TF-30 is a transmission electron microscope (TEM) that can also be operated in scanning transmission electron microscopy (STEM) mode, with a voltage range of 50 to 300 kV. Operation at 300 kV makes this the KNI's highest resolution TEM (see also the 200 kV [[Tecnai_TF-20:_200_kV_TEM,_STEM,_EDS,_EELS,_EFTEM_%26_Lithography | Tecnai TF-20]], which has more analytical options such as EELS and EFTEM). The TF-30 is also equipped with a high-angle annular dark field (HAADF) detector for use in STEM mode, and an energy dispersive spectroscopy (EDS) detector for compositional analysis (in both TEM mode and, most often, in STEM mode). The Serial EM program allows for automated collection of images at variable tilt angles for performing tomography. See a full list of training and educational resources for this instrument below.
===== Applications =====
===== Applications =====
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== Resources ==
== Resources ==
===== SOPs & Troubleshooting =====
===== SOPs & Troubleshooting =====
* [https://caltech.box.com/s/v7oih7yv8yxai5ybkg8znplc54xc99if SOP Guide]
* SOPs ([https://caltech.box.com/s/v7oih7yv8yxai5ybkg8znplc54xc99if Long Version] | [https://caltech.box.com/s/uq2x3x6jfbrwm7sll3zfvb4h4naip7rj Short, Conceptual Version])
* [https://caltech.box.com/s/b5h0v6s2ethshh2fs5o4eqwf7pe8sdwc Troubleshooting Guide]
* [https://caltech.box.com/s/b5h0v6s2ethshh2fs5o4eqwf7pe8sdwc Troubleshooting Guide]
===== Manufacturer Resources =====
===== Manufacturer Resources =====

Revision as of 00:19, 1 October 2019

Tecnai TF-30
Mouse-Footpad-Peripheral-Nerve-Fiber-3D-Tomography Mark-S-Ladinksy.jpg
Instrument Type Microscopy
Techniques TEM, STEM,
Bright & Dark Field Imaging,
EDS, HAADF,
Electron Diffraction,
Tomography
Staff Manager Matthew S. Hunt, PhD
Staff Email matthew.hunt@caltech.edu
Staff Phone 626-395-5994
Reserve time on LabRunr
Request training by email
Sign up for TF-30 email list
Lab Location B242F Keck
Lab Phone 626-395-8908
Manufacturer FEI (now Thermo Fisher)
Model Tecnai TF-30
Tecnai-TF30.jpg

Description

A schematic of the KNI's Tecnai TF-30 TEM/STEM, with attachments. Modified from an original schematic that is courtesy Portland State University.

The Tecnai TF-30 is a transmission electron microscope (TEM) that can also be operated in scanning transmission electron microscopy (STEM) mode, with a voltage range of 50 to 300 kV. Operation at 300 kV makes this the KNI's highest resolution TEM (see also the 200 kV Tecnai TF-20, which has more analytical options such as EELS and EFTEM). The TF-30 is also equipped with a high-angle annular dark field (HAADF) detector for use in STEM mode, and an energy dispersive spectroscopy (EDS) detector for compositional analysis (in both TEM mode and, most often, in STEM mode). The Serial EM program allows for automated collection of images at variable tilt angles for performing tomography. See a full list of training and educational resources for this instrument below.

Applications
  • High-Resolution TEM (HRTEM) imaging without an objective aperture
  • Bright Field (BF) & Dark Field (DF) imaging with an objective aperture
  • Selected Area Electron Diffraction (SAED)
  • STEM imaging with a High-Angle Annular Dark Field (HAADF) detector
  • Energy Dispersive Spectroscopy (EDS) with an Oxford INCA system
  • Automatically capture tilt series of images for tomographic imaging

Resources

SOPs & Troubleshooting
Manufacturer Resources
  • Full manufacturer manual is accessible via the UI under the Help menu
Other Online Resources
Sample Preparation
  • Sample preparation is a highly specific task related to each sample type and is therefore primarily the responsibility of the user to carry out.
    • KNI staff can teach users how to create lamellae from a bulk specimen using an SEM/Ga-FIB system (see SOP and YouTube playlist)
    • The KNI also has a TEM sample preparation lab that is primarily used to make cross-section samples by traditional methods (i.e. glue together a stack, cut out 3 mm core, thin by polishing, dimple, then final polish with argon mill); inquire with staff for help with these sample preparation tools
Order Your Own Grids
  • Grids used for mounting specimens are considered a personal, consumable item in the KNI. You are required to supply your own grids.

Specifications

Manufacturer Specifications
TEM & STEM Specifications
  • From FEI’s (now Thermo Fisher’s) Tecnai G2 F30 Family
  • Voltage Range: 50-300 kV
  • Point resolution: 0.20 nm
  • Line resolution: 0.10 nm
  • STEM resolution: 0.17 nm
  • Information limit: 0.14 nm
  • Energy spread: 0.7 eV
  • Max alpha-tilt angle with double-tilt holder: ±40°
  • Max alpha-tilt angle with tomography holder: ±80°
  • Maximum diffraction angle: ±12°
  • Camera length: 35–2300 mm
  • EDS solid angle: 0.13 srad



Related Instrumentation in the KNI

Transmission Electron Microscopes
Sample Preparation for TEM
Scanning Electron Microscopes (SEMs)
Focused Ion Beam (FIB) Systems
Sample Preparation for Microscopy