Difference between revisions of "Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF"

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|InstrumentName = Tecnai TF-30
|InstrumentName = Tecnai TF-30
|HeaderColor = #F5A81C
|HeaderColor = #F5A81C
|ImageOne = Tecnai-TF30.jpg
|ImageOne = Mouse-Footpad-Peripheral-Nerve-Fiber-3D-Tomography_Mark-S-Ladinksy.jpg
|ImageTwo = Tecnai-TF30.jpg
|ImageTwo = Tecnai-TF30.jpg
|InstrumentType = [[Equipment_List#Microscopy|Microscopy]]
|InstrumentType = [[Equipment_List#Microscopy|Microscopy]]
|RoomLocation = B242F Keck
|RoomLocation = B242F Keck
|LabPhone = 626-395-8908
|LabPhone = 626-395-8908
|PrimaryStaff = [[Matthew S. Hunt, PhD]]
|PrimaryStaff = [[Annalena Wolff]]
|StaffEmail = matthew.hunt@caltech.edu
|StaffEmail = awolff@caltech.edu
|StaffPhone = 626-395-5994
|StaffPhone = 626-395-5994
|Manufacturer = FEI (now Thermo Fisher)
|Manufacturer = FEI (now Thermo Fisher)
|Model = Tecnai TF-30
|Techniques = TEM, STEM,<br>Bright & Dark Field Imaging,<br>EDS, HAADF,<br>Electron Diffraction,<br>Tomography
|Techniques = TEM, STEM,<br>Bright & Dark Field Imaging,<br>EDS, HAADF,<br>Electron Diffraction,<br>Tomography
|RequestTraining = matthew.hunt@caltech.edu
|RequestTraining = derose@caltech.edu
|EmailList = kni-tf30
|EmailList = kni-tf30
|EmailListName = TF-30
|EmailListName = TF-30
}}
}}
== Description ==
== Description ==
The Tecnai TF-30 is a transmission electron microscope (TEM) that can also be operated in scanning transmission electron microscopy (STEM) mode, with a voltage range of 80 to 300 kV. Operation at 300 kV makes this the KNI's highest resolution TEM (see also the 200 kV [[Tecnai_TF-20:_200_kV_TEM,_STEM,_EDS,_EELS,_EFTEM_%26_Lithography | Tecnai TF-20]]). The TF-30 is also equipped with a high-angle annular dark field (HAADF) detector for use in STEM mode, and an energy dispersive spectroscopy (EDS) detector for compositional analysis (in both TEM mode and, most usually, in STEM mode). The Serial EM program allows for automated collection of images at variable tilt angles for performing tomography. See a full list of training and educational resources for this instrument below.
[[Image:TF-30-Schematic-KNI-Caltech.jpg|thumb|top|upright=1.00|A schematic of the KNI's Tecnai TF-30 TEM/STEM. Modified from an original schematic that is courtesy of Portland State University.]]
The Tecnai TF-30 is a transmission electron microscope (TEM) that can also be operated in scanning transmission electron microscopy (STEM) mode, with a voltage range of 50 to 300 kV. Operating at 300 kV, the TF-30 <!---KNI's highest resolution TEM (see also the 200 kV [[Tecnai_TF-20:_200_kV_TEM,_STEM,_EDS,_EELS,_EFTEM_%26_Lithography | Tecnai TF-20]], which---> has analytical options such as EELS and EFTEM. The TF-30 is also equipped with a high-angle annular dark field (HAADF) detector for use in STEM mode, and an energy dispersive spectroscopy (EDS) detector for compositional analysis (in both TEM mode and, most often, in STEM mode). The Serial EM program allows for automated collection of images at variable tilt angles for performing tomography. See a full list of training and educational resources for this instrument below.
===== Applications =====
===== Applications =====
* High-Resolution TEM (HRTEM) imaging without an objective aperture
* High-Resolution TEM (HRTEM) imaging without an objective aperture
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* Selected Area Electron Diffraction (SAED)  
* Selected Area Electron Diffraction (SAED)  
* STEM imaging with a High-Angle Annular Dark Field (HAADF) detector
* STEM imaging with a High-Angle Annular Dark Field (HAADF) detector
* Energy Dispersive Spectroscopy (EDS) with Oxford INCA system
* Energy Dispersive Spectroscopy (EDS) with an Oxford INCA system
* Automatically capture tilt series of images for tomographic imaging
* Automatically capture tilt series of images for tomographic imaging


== Resources ==
== Resources ==
===== Equipment Status =====
* [https://labrunr.caltech.edu/Equipment_2.aspx LabRunr Equipment Status] (Select Tecnai TF-30 from the dropdown menu)
===== SOPs & Troubleshooting =====
===== SOPs & Troubleshooting =====
* [https://caltech.box.com/s/v7oih7yv8yxai5ybkg8znplc54xc99if SOP Guide]
* [https://caltech.box.com/s/mpsxkxmf5y8wjw9daijwbudeoqkkeudu KNI Microscopy Policies]
* SOPs ([https://caltech.box.com/s/v7oih7yv8yxai5ybkg8znplc54xc99if Long Version] | [https://caltech.box.com/s/uq2x3x6jfbrwm7sll3zfvb4h4naip7rj Short, Conceptual Version])
* [https://caltech.box.com/s/lstv8e5zy94fnt3o0y7urfw41mpesd38 Procedure to Evaluate Selected Area Electron Diffraction (SAED) Patterns]
**[https://caltech.box.com/s/59upcnvhlqulnazm51b0dihd942xebn3 All Resources for SAED Evaluation, including DPs captured of standard samples]
* [https://caltech.box.com/s/b5h0v6s2ethshh2fs5o4eqwf7pe8sdwc Troubleshooting Guide]
* [https://caltech.box.com/s/b5h0v6s2ethshh2fs5o4eqwf7pe8sdwc Troubleshooting Guide]
===== Manufacturer Manuals =====
 
* [https://caltech.box.com/s/og4309108q4k2jwhkaxqtpiujg2al5iu Tecnai TF-30 Manual (BROKEN)]
===== Manufacturer Resources =====
* Full manufacturer manual is accessible via the UI under the ''Help'' menu
===== Other Online Resources =====
* Rodenburg.org's [http://www.rodenburg.org/guide/index.html Learn to Use a TEM]
 
===== Sample Preparation =====
===== Sample Preparation =====
* Sample preparation is a highly specific task related to each sample type and is therefore primarily the responsibility of the user to carry out.  
* Sample preparation is a highly specific task related to each sample type and is therefore primarily the responsibility of the user to carry out.  
** KNI staff can teach users how to create lamellae from a bulk specimen using an SEM/Ga-FIB system (see [https://caltech.box.com/s/3l3w507dxwosuya3nbxgk30tdqyp4qy9 SOP] and [https://www.youtube.com/playlist?list=PL7Lb5X_YIzOkg3wRe6A5a5b76fFxYyT3s YouTube playlist])
** KNI staff can teach users how to create lamellae from a bulk specimen using an [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe | SEM/Ga-FIB system]] (see [https://caltech.box.com/s/3l3w507dxwosuya3nbxgk30tdqyp4qy9 SOP] and [https://www.youtube.com/playlist?list=PL7Lb5X_YIzOkg3wRe6A5a5b76fFxYyT3s YouTube playlist])
** The KNI also has a TEM sample preparation lab that is primarily used to make cross-section samples by traditional methods (i.e. glue together a stack, cut out 3 mm core, thin by polishing, dimple, then final polish with argo mill); inquire with staff for help with these tools
** The KNI also has a [[TEM Sample Preparation Equipment | TEM sample preparation lab]] that is primarily used to make cross-section samples by traditional methods (i.e. glue together a stack, cut out 3 mm core, thin by polishing, dimple, then final polish with argon mill); inquire with staff for help with these sample preparation tools
 
===== Order Your Own Grids =====
===== Order Your Own Grids =====
* Grids used for mounting specimens are considered a personal, consumable item in the KNI. You are required to supply your own grids.
* Grids used for mounting specimens are considered a personal, consumable item in the KNI. You are required to supply your own grids.
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===== TEM & STEM Specifications =====
===== TEM & STEM Specifications =====
* From FEI’s (now Thermo Fisher’s) Tecnai G<sup>2</sup> F30 Family
* From FEI’s (now Thermo Fisher’s) Tecnai G<sup>2</sup> F30 Family
* Voltage Range: 80-300 kV
* Voltage Range: 50-300 kV
* Point resolution: 0.20 nm
* Point resolution: 0.20 nm
* Line resolution: 0.10 nm
* Line resolution: 0.10 nm
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* Camera length: 35–2300 mm
* Camera length: 35–2300 mm
* EDS solid angle: 0.13 srad
* EDS solid angle: 0.13 srad
<br>
<br>
== Related Instrumentation in the KNI ==
===== Transmission Electron Microscope =====
* [[Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF | Tecnai TF-30: TEM, STEM, EDS & HAADF (50-300 kV)]]
===== Sample Preparation for TEM =====
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe]]
* [[TEM Sample Preparation Equipment | TEM Sample Preparation Equipment: Polishing Stations, 3 mm Disk Cutter, Dimpler, Argon Ion Mill]]
===== Scanning Electron Microscopes (SEMs) =====
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe]]
* [[Nova 200 NanoLab: SEM, EDS & WDS | Nova 200 NanoLab: SEM, EDS & WDS]]
* [[Sirion: SEM & EDS | Sirion: SEM & EDS]]
* [[Quanta 200F: SEM, ESEM, Lithography & Probe Station | Quanta 200F: SEM, ESEM, Lithography & Probe Station]]
===== Focused Ion Beam (FIB) Systems =====
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe]]
* [[ORION NanoFab: Helium, Neon & Gallium FIB | ORION NanoFab: Helium, Neon & Gallium FIB]]
===== Sample Preparation for Microscopy =====
* [[Carbon Evaporator | Carbon Evaporator (Leica EM ACE600) to make samples conductive]]
* [[Tergeo Plus ICP- & CCP-RIE: Oxygen & Argon Plasma Cleaner | Oxygen & Argon Plasma Cleaner (Tergeo Plus ICP- & CCP-RIE) to remove hydrocarbons from surface]]

Latest revision as of 05:21, 30 June 2022

Tecnai TF-30
Mouse-Footpad-Peripheral-Nerve-Fiber-3D-Tomography Mark-S-Ladinksy.jpg
Instrument Type Microscopy
Techniques TEM, STEM,
Bright & Dark Field Imaging,
EDS, HAADF,
Electron Diffraction,
Tomography
Staff Manager Annalena Wolff
Staff Email awolff@caltech.edu
Staff Phone 626-395-5994
Reserve time on LabRunr
Request training by email
Sign up for TF-30 email list
Lab Location B242F Keck
Lab Phone 626-395-8908
Manufacturer FEI (now Thermo Fisher)
Model Tecnai TF-30
Tecnai-TF30.jpg

Description

A schematic of the KNI's Tecnai TF-30 TEM/STEM. Modified from an original schematic that is courtesy of Portland State University.

The Tecnai TF-30 is a transmission electron microscope (TEM) that can also be operated in scanning transmission electron microscopy (STEM) mode, with a voltage range of 50 to 300 kV. Operating at 300 kV, the TF-30 has analytical options such as EELS and EFTEM. The TF-30 is also equipped with a high-angle annular dark field (HAADF) detector for use in STEM mode, and an energy dispersive spectroscopy (EDS) detector for compositional analysis (in both TEM mode and, most often, in STEM mode). The Serial EM program allows for automated collection of images at variable tilt angles for performing tomography. See a full list of training and educational resources for this instrument below.

Applications
  • High-Resolution TEM (HRTEM) imaging without an objective aperture
  • Bright Field (BF) & Dark Field (DF) imaging with an objective aperture
  • Selected Area Electron Diffraction (SAED)
  • STEM imaging with a High-Angle Annular Dark Field (HAADF) detector
  • Energy Dispersive Spectroscopy (EDS) with an Oxford INCA system
  • Automatically capture tilt series of images for tomographic imaging

Resources

Equipment Status
SOPs & Troubleshooting
Manufacturer Resources
  • Full manufacturer manual is accessible via the UI under the Help menu
Other Online Resources
Sample Preparation
  • Sample preparation is a highly specific task related to each sample type and is therefore primarily the responsibility of the user to carry out.
    • KNI staff can teach users how to create lamellae from a bulk specimen using an SEM/Ga-FIB system (see SOP and YouTube playlist)
    • The KNI also has a TEM sample preparation lab that is primarily used to make cross-section samples by traditional methods (i.e. glue together a stack, cut out 3 mm core, thin by polishing, dimple, then final polish with argon mill); inquire with staff for help with these sample preparation tools
Order Your Own Grids
  • Grids used for mounting specimens are considered a personal, consumable item in the KNI. You are required to supply your own grids.

Specifications

Manufacturer Specifications
TEM & STEM Specifications
  • From FEI’s (now Thermo Fisher’s) Tecnai G2 F30 Family
  • Voltage Range: 50-300 kV
  • Point resolution: 0.20 nm
  • Line resolution: 0.10 nm
  • STEM resolution: 0.17 nm
  • Information limit: 0.14 nm
  • Energy spread: 0.7 eV
  • Max alpha-tilt angle with double-tilt holder: ±40°
  • Max alpha-tilt angle with tomography holder: ±80°
  • Maximum diffraction angle: ±12°
  • Camera length: 35–2300 mm
  • EDS solid angle: 0.13 srad



Related Instrumentation in the KNI

Transmission Electron Microscope
Sample Preparation for TEM
Scanning Electron Microscopes (SEMs)
Focused Ion Beam (FIB) Systems
Sample Preparation for Microscopy
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