Yonghwi Kim: Difference between revisions
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===== High-vacuum thin film deposition for high resolution SEM and TEM applications ===== | ===== High-vacuum thin film deposition for high resolution SEM and TEM applications ===== | ||
* [[Conductive Layer Coating (Carbon & Au): Leica EM ACE600 Carbon Evaporator & Sputter Coater | Leica LM ACE600]] | * [[Conductive Layer Coating (Carbon & Au): Leica EM ACE600 Carbon Evaporator & Sputter Coater | Leica LM ACE600]] | ||
===== Scanning Probe Microscopes ===== | ===== Scanning Probe Microscopes ===== | ||
* [[Dimension Icon: Atomic Force Microscope (AFM) | Atomic Force Microscope (AFM): Bruker Dimension Icon]] | * [[Dimension Icon: Atomic Force Microscope (AFM) | Atomic Force Microscope (AFM): Bruker Dimension Icon]] | ||
* [[Dektak 3ST: Profilometer | Profilometer: Veeco Dektak 3ST]] | * [[Dektak 3ST: Profilometer | Profilometer: Veeco Dektak 3ST]] | ||
<!---* [[ Nova 200 NanoLab: SEM & EDS]]---!> | |||
== Selected Publications == | == Selected Publications == | ||
Revision as of 05:21, 13 November 2025
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About
Role in the KNI
Yonghwi Kim is the Electron and Ion Microscope Manager at the Kavli Nanoscience Institute (KNI) at the California Institute of Technology. He oversees the daily operation of the Quanta scanning electron microscope (SEM) with environmental mode (ESEM), Sirion field emission SEM, Nova 600 focused ion beam (FIB), Zeiss ORION NanoFab Helium/Neon/Gallium FIB, atomic force microscope, and profilometer. In this role, he trains researchers in equipment operation and provides technical support to enable impactful scientific discoveries.
Yonghwi joined Caltech in 2013 as a Ph.D. student in Electrical Engineering, conducting his doctoral research in Prof. Harry A. Atwater’s group on electrically reconfigurable nanophotonic devices based on phase-transition materials. After completing his Ph.D., he pursued postdoctoral research at NTT Research while serving as a Visiting Associate at Caltech, where he advanced nanofabrication methods for nonlinear optical waveguides in the KNI cleanroom. He returned to Caltech in 2025 to continue his technical career as the Electron and Ion Microscope Manager at the KNI.
Education
Yonghwi received his Ph.D. and M.S. degrees in Electrical Engineering from Caltech under the supervision of Prof. Harry A. Atwater. Prior to that, he earned his B.S. and M.S. degrees in Electrical and Electronic Engineering from Yonsei University in Seoul, South Korea, advised by Prof. Donghyun Kim.
List of Managed Instruments
Focused Ion Beam (FIB) Systems
- Helium, Neon & Gallium FIB: Zeiss ORION NanoFab
- SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab
Scanning Electron Microscopes (SEMs)
- SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab
- SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F
- Sirion: SEM & EDS