Yonghwi Kim: Difference between revisions
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== List of Managed Instruments == | == List of Managed Instruments == | ||
===== Focused Ion Beam (FIB) Systems ===== | ===== Focused Ion Beam (FIB) Systems ===== | ||
* [[ORION NanoFab: Helium, Neon & Gallium FIB | Helium, Neon & Gallium FIB: Zeiss ORION NanoFab]] | * [[ORION NanoFab: Helium, Neon & Gallium FIB | Helium, Neon & Gallium FIB: Zeiss ORION NanoFab]] | ||
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* [[Dimension Icon: Atomic Force Microscope (AFM) | Atomic Force Microscope (AFM): Bruker Dimension Icon]] | * [[Dimension Icon: Atomic Force Microscope (AFM) | Atomic Force Microscope (AFM): Bruker Dimension Icon]] | ||
* [[Dektak 3ST: Profilometer | Profilometer: Veeco Dektak 3ST]] | * [[Dektak 3ST: Profilometer | Profilometer: Veeco Dektak 3ST]] | ||
== Selected Publications == | |||
Latest revision as of 20:50, 29 September 2025
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About
Role in the KNI
Yonghwi Kim is the Electron and Ion Microscope Manager for The Kavli Nanoscience Institute (KNI) at the California Institute of Technology. He oversees the daily management of the Quanta ESEM, Sirion FESEM, Nova 600 focused ion beam, Zeiss Orion Nanofab helium ion microscope, atomic force microscope, and the profilometer.
Education
Yonghwi received his Ph.D. and M.S. in Electrical Engineering from Caltech under Prof. Harry A. Atwater. Thesis title: Light modulation with vanadium dioxide-based optical devices.
List of Managed Instruments
Focused Ion Beam (FIB) Systems
- Helium, Neon & Gallium FIB: Zeiss ORION NanoFab
- SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab
Scanning Electron Microscopes (SEMs)
- Nova 200 NanoLab: SEM & EDS
- Sirion: SEM & EDS
- SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F
- SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab