Yonghwi Kim: Difference between revisions
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__NOTOC__ | |||
{{StaffMemberInfobox | |||
|StaffName = Yonghwi Kim | |||
|StaffPhoto = | |||
|JobTitle = Electron and Ion Microscope Manager | |||
|AreasResponsibility = Scanning electron microscopes, focused ion beam, helium ion beam, AFM, profilometer | |||
|CaltechID = ykim | |||
|Phone = 626-395-3371 (office) | |||
|OfficeLocation = 303 Steele | |||
}} | |||
== About == | |||
===== Role in the KNI ===== | |||
Yonghwi Kim is the Electron and Ion Microscope Manager for The Kavli Nanoscience Institute (KNI) at the California Institute of Technology. He oversees the daily management of the Quanta ESEM, Sirion FESEM, Nova 600 focused ion beam, Zeiss Orion Nanofab helium ion microscope, atomic force microscope, and the profilometer. | |||
===== Education ===== | |||
Yonghwi received his Ph.D. and M.S. in Electrical Engineering from Caltech under Prof. Harry A. Atwater. Thesis title: Light modulation with vanadium dioxide-based optical devices. | |||
== List of Managed Instruments == | |||
===== Focused Ion Beam (FIB) Systems ===== | |||
* [[ORION NanoFab: Helium, Neon & Gallium FIB | Helium, Neon & Gallium FIB: Zeiss ORION NanoFab]] | |||
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe | SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab]] | |||
===== Scanning Electron Microscopes (SEMs) ===== | |||
* [[Nova 200 NanoLab: SEM & EDS | Nova 200 NanoLab: SEM & EDS]] | |||
* [[Sirion: SEM & EDS | Sirion: SEM & EDS]] | |||
* [[Quanta 200F: SEM, ESEM, Lithography & Probe Station | SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F]] | |||
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab]] | |||
===== Scanning Probe Microscopes ===== | |||
* [[Dimension Icon: Atomic Force Microscope (AFM) | Atomic Force Microscope (AFM): Bruker Dimension Icon]] | |||
* [[Dektak 3ST: Profilometer | Profilometer: Veeco Dektak 3ST]] | |||
== Selected Publications == | |||
Latest revision as of 20:50, 29 September 2025
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About
Role in the KNI
Yonghwi Kim is the Electron and Ion Microscope Manager for The Kavli Nanoscience Institute (KNI) at the California Institute of Technology. He oversees the daily management of the Quanta ESEM, Sirion FESEM, Nova 600 focused ion beam, Zeiss Orion Nanofab helium ion microscope, atomic force microscope, and the profilometer.
Education
Yonghwi received his Ph.D. and M.S. in Electrical Engineering from Caltech under Prof. Harry A. Atwater. Thesis title: Light modulation with vanadium dioxide-based optical devices.
List of Managed Instruments
Focused Ion Beam (FIB) Systems
- Helium, Neon & Gallium FIB: Zeiss ORION NanoFab
- SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab
Scanning Electron Microscopes (SEMs)
- Nova 200 NanoLab: SEM & EDS
- Sirion: SEM & EDS
- SEM, ESEM, Lithography & Probe Station: Thermo Fisher Quanta 200F
- SEM, Ga-FIB, GIS & Omniprobe: Thermo Fisher Nova 600 NanoLab