TEM Sample Preparation Equipment

TEM Sample Prep Tools Instrument Type Support Tools, Sample Prep for Microscopy Techniques Cross-Section Sample Prep, Sample Polishing, 3 mm Core Drilling, Dimpling, Argon Milling Staff Manager Matthew S. Hunt, PhD Staff Email matthew.hunt@caltech.edu Staff Phone 626-395-5994 Reserve time on LabRunr Request training by email Sign up for TF-30 email list Lab Location B242A Keck Lab Phone 626-395-8908 Manufacturer Assorted (see list on page) Model Assorted (see list on page) [[image:|320px|center|]]

Description

The KNI offers a lab in the Keck sub-basement for preparing TEM samples by traditional means, often to produce cross-section specimens from a bulk sample. This typically involves the following steps:

1. Glue together a stack of materials, e.g. with the surface of two samples facing each other
   (if the surface is what you want to observe in the TEM)
2. Cut the stack into thin slices of material, in the appropriate orientation
   (the thin dimension here will be the same thin dimension in the TEM)
3. Cut out a 3 mm circle from this thin slice using a Disk Cutter
4. Polish that thin disk down to a thickness of ~100 μm
5. Use a Dimpler to polish a hemispherical dimple into the middle of the disk,
   such that only a few microns of material remain at the thinnest portion
6. Use an Argon Mill to perform the final polish of the thinnest portion,
   until a hole has been bored through the middle and
   the edges of that hole are thin enough to be electron-transparent in the TEM

List of Equipment Available

The Dimpler (left) and 3 mm Disk Cutter (right)

The polishing station with automated handling of the polishing jig and control of its sweeping motion

• Low-Angle Argon Milling & Polishing Station: Fischione Model 1010 (shown in infobox image)
• Dimpler: Fischione Model 2000
• Ultrasonic Disk Cutter: Model 170
• Polishing Station: Allied TechPrep
• Polishing Station: Buehler Ecomet 3
• Low Speed Saw: Isomet
• Roll Grinder: Buehler Handimet 2
• Various polishing media & accessories:
  • Media: grit paper, lapping films, polishing cloths, diamond suspensions, alumina poweders
  • Accessories: tripod polisher (South Bay Technology), endpoint polisher (Fischione Model 160)

Resources

SOPs

• Paper copies of SOPs are available in the lab for the Argon Ion Mill & Dimpler

Manufacturer Manuals

• Fischione Model 1010 Argon Ion Mill

Videos

• Ultrasonic Disk Cutter Model 170 Operation

Related Instrumentation in the KNI

Transmission Electron Microscopes

• Tecnai TF-30: TEM, STEM, EDS & HAADF (50-300 kV)
• Tecnai TF-20: TEM, STEM, EDS, EELS, EFTEM & Lithography (40-200 kV)

Sample Preparation for TEM

• Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe
• TEM Sample Preparation Equipment: Polishing Stations, 3 mm Disk Cutter, Dimpler, Argon Ion Mill

Sample Preparation for Microscopy

• Carbon Evaporator (Leica EM ACE600) to make samples conductive
• Oxygen & Argon Plasma Cleaner (Tergeo Plus ICP- & CCP-RIE) to remove hydrocarbons from surface