Difference between revisions of "Dektak 3ST: Profilometer"
Jump to navigation
Jump to search
m |
|||
| Line 26: | Line 26: | ||
===== SOPs ===== | ===== SOPs ===== | ||
* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP] | * [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP] | ||
== Related Instrumentation in the KNI == | |||
===== Scanning Probe Microscopes ===== | |||
* [[Dimension Icon: Atomic Force Microscope (AFM) | Dimension Icon: Atomic Force Microscope (AFM)]] | |||
* [[Dektak 3ST: Profilometer | Dektak 3ST: Profilometer]] | |||
Revision as of 00:01, 12 September 2019
|
Description
The Dektak 3ST profilometer is a stylus-type surface profiler. It is equipped with a camera for locating the region of interest, manual sample manipulation & tilt correction, and profile analysis software. It can be used to get a rough idea of the topography of features by scanning a single line across the surface. Features as small as 100 nm in height can be determined with some approximation.
Applications
- Surface Profiling