Dektak 3ST: Profilometer: Difference between revisions
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===== SOPs ===== | ===== SOPs ===== | ||
* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP] | * [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP] | ||
* [https://caltech.box.com/s/j6br8jpkr7ov0k9dwx7wzyzt9f5fj3rt Dektak Operations Manual] | |||
<br> | <br> | ||
<br> | <br> | ||
== Related Instrumentation in the KNI == | == Related Instrumentation in the KNI == | ||
===== Scanning Probe Microscopes ===== | ===== Scanning Probe Microscopes ===== | ||
* [[Dimension Icon: Atomic Force Microscope (AFM) | Dimension Icon: Atomic Force Microscope (AFM)]] | * [[Dimension Icon: Atomic Force Microscope (AFM) | Dimension Icon: Atomic Force Microscope (AFM)]] | ||
* [[Dektak 3ST: Profilometer | Dektak 3ST: Profilometer]] | * [[Dektak 3ST: Profilometer | Dektak 3ST: Profilometer]] | ||
Latest revision as of 00:51, 24 April 2024
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Description
The Dektak 3ST profilometer is a stylus-type surface profiler. It is equipped with a camera for locating the region of interest, manual sample manipulation & tilt correction, and profile analysis software. It can be used to get a rough idea of the topography of features by scanning a single line across the surface. Features as small as 100 nm in height can be determined with some approximation.
Applications
- Surface Profiling
Resources
SOPs