Light Microscope with Spectroscopic Reflectometer: Difference between revisions

From the KNI Lab at Caltech
Jump to navigation Jump to search
No edit summary
No edit summary
 
(5 intermediate revisions by 2 users not shown)
Line 7: Line 7:
|RoomLocation = B217 Steele
|RoomLocation = B217 Steele
|LabPhone = 626-395-1535
|LabPhone = 626-395-1535
|PrimaryStaff = [[Bert Mendoza]]
|PrimaryStaff = Alireza Ghaffari
|StaffEmail = bertm@caltech.edu
|StaffEmail = alireza@caltech.edu
|StaffPhone = 626-395-4075
|StaffPhone = 626-395-3984
|Manufacturer = Olympus / Filmetrics
|Manufacturer = Olympus / Filmetrics
|Model = BX51M / F40
|Model = BX51M / F40
Line 25: Line 25:
== Resources ==
== Resources ==
===== SOP =====
===== SOP =====
* [https://caltech.app.box.com/file/967699756432 KNI SOP]
* [https://caltech.box.com/s/sztwanjtw3ro1rm2h638qbwdljfs0sq0 KNI SOP]


===== Manufacturer Manuals =====
===== Manufacturer Manuals =====
* [https://caltech.app.box.com/file/967699704785 Microscope Manual]
* [https://caltech.box.com/s/uvxpaugne3poa6s91ljdyxw64r3hzwoj Microscope Manual]
* [https://caltech.app.box.com/file/953578875131?s=2gqm0ucq8t5rjkzixg0x0y4bo0d643pf Filmetrics Manual]
* [https://caltech.box.com/s/mjvrqf3mcido11wogctgrnoyfcasgz42 Filmetrics Manual]


== Specifications ==
== Specifications ==

Latest revision as of 15:41, 19 July 2023

Light Microscope with Reflectometry
Olympus-BX51M-with-Filmetrics-F40.jpg
Instrument Type Optical Characterization
Techniques Optical Microscopy,
Spectroscopic Reflectometry
Staff Manager Alireza Ghaffari
Staff Email alireza@caltech.edu
Staff Phone 626-395-3984
Reserve time on FBS
Request training via FBS User Dashboard
Lab Location B217 Steele
Lab Phone 626-395-1535
Manufacturer Olympus / Filmetrics
Model BX51M / F40

Description

This light microscope (Olympus BX51M) can be used to observe patterns and samples optically via 5x, 10x, 50x and 100x objective lenses. It also is equipped with a spectroscopic reflectometer (Filmetrics model F40) that can measure the thickness of transparent and translucent thin films. Spectroscopic reflectometry works by comparing the spectral amplitude and periodicity of light that is reflected at normal incidence from a thin film against the light that is reflected from a known reference sample; the results are fit to a mathematical model that takes into account estimated values for n (refractive index), k (absorption coefficient), and thickness.

Applications
  • Optical imaging
  • Thickness determinations

Resources

SOP
Manufacturer Manuals

Specifications

  • Objective Lenses: 5x, 10x, 50x, 100x
  • Optical Image Modes: Bright Field, Dark Field
  • Thickness Range: 20 nm to 40 μm
  • Wavelength Range: 400 to 850 nm