View source for Tecnai TF-20: 200 kV TEM, STEM, EDS, EELS, EFTEM & Lithography

{{InstrumentInfobox|
|InstrumentName = Tecnai TF-20
|HeaderColor = #F5A81C
|ImageOne = 10-fold-Rotation-Axis-Quasicrystal_Jinping-Hu.jpg
|ImageTwo = Tecnai-TF20.jpg
|InstrumentType = [[Equipment_List#Microscopy|Microscopy]], [[Equipment_List#Lithography|Lithography]]
|RoomLocation = B203C Steele
|LabPhone = 626-395-1543
|PrimaryStaff = [[Matthew S. Hunt, PhD]]
|StaffEmail = matthew.hunt@caltech.edu
|StaffPhone = 626-395-5994
|Manufacturer = FEI (now Thermo Fisher)
|Model = Tecnai TF-20
|Techniques = TEM, STEM,<br>Bright & Dark Field Imaging,<br>EDS, HAADF,<br>Electron Diffraction,<br>Tomography
|RequestTraining = matthew.hunt@caltech.edu
|EmailList = kni-tf20
|EmailListName = TF-20
}}
== Description ==
The Tecnai TF-20 is a transmission electron microscope (TEM) that can also be operated in scanning transmission electron microscopy (STEM) mode, with a voltage range of 40 to 200 kV. The TF-20 is equipped with bright field, dark field, and secondary electron detectors for use in STEM mode, an energy dispersive spectroscopy (EDS) detector for compositional analysis (in both TEM mode and, most often, in STEM mode), electron energy loss spectroscopy (EELS) & energy-filtered TEM (EFTEM), and a nanometer pattern generating system (NPGS) for performing lithography. Note that the KNI also has a 300 kV TEM, the [[Tecnai_TF-30:_300_kV_TEM,_STEM,_EDS_%26_HAADF | Tecnai TF-30]], which achieves higher resolution (albeit with fewer analytical options). See a full list of training and educational resources for this instrument below.
===== Applications =====
* High-Resolution TEM (HRTEM) imaging without an objective aperture
* Bright Field (BF) & Dark Field (DF) imaging with an objective aperture
* Selected Area Electron Diffraction (SAED) 
* STEM imaging with a BF, DF & Secondary Electron (SE) detector
* Energy Dispersive Spectroscopy (EDS) with an EDAX Genesis system
* Electron Energy Loss Spectroscopy (EELS) & Energy-Filtered TEM (EFTEM)
* E-beam lithography with Nanometer Pattern Generating System (NPGS) software

== Resources ==
===== SOPs & Troubleshooting =====
* [https://caltech.box.com/s/edhsxq6h88iw0r8gkwn3jjj9lic86h1r SOP Guide]
* [https://caltech.box.com/s/gtoi3purzlgw5po7tu71nxwmk4uepdjh Troubleshooting Guide]

===== Manufacturer Resources =====
* Full manufacturer manual is accessible via the UI under the ''Help'' menu
===== Other Online Resources =====
* Rodenburg.org's [http://www.rodenburg.org/guide/index.html Learn to Use a TEM]
===== Sample Preparation =====
* Sample preparation is a highly specific task related to each sample type and is therefore primarily the responsibility of the user to carry out. 
** KNI staff can teach users how to create lamellae from a bulk specimen using an SEM/Ga-FIB system (see [https://caltech.box.com/s/3l3w507dxwosuya3nbxgk30tdqyp4qy9 SOP] and [https://www.youtube.com/playlist?list=PL7Lb5X_YIzOkg3wRe6A5a5b76fFxYyT3s YouTube playlist])
** The KNI also has a [[TEM Sample Preparation Equipment | TEM sample preparation lab]] that is primarily used to make cross-section samples by traditional methods (i.e. glue together a stack, cut out 3 mm core, thin by polishing, dimple, then final polish with argon mill); inquire with staff for help with these sample preparation tools
===== Order Your Own Grids =====
* Grids used for mounting specimens are considered a personal, consumable item in the KNI. You are required to supply your own grids.

== Specifications ==
===== Manufacturer Specifications =====
* [https://caltech.box.com/s/eefl2jz6x1srmj4zx5165iwp217tbmzk TF-20 Product Guide & Specifications]
===== TEM & STEM Specifications =====
* From FEI’s (now Thermo Fisher’s) Tecnai G<sup>2</sup> 20 Family
* Voltage Range: 80-300 kV
* Point resolution: 0.27 nm
* Line resolution: 0.144 nm
* STEM resolution: 1.0 nm 
* Information limit: 0.18 nm
* Energy spread: 0.7 eV
* Max alpha-tilt angle with double-tilt holder: ±50&deg;
* Maximum diffraction angle: ±10&deg;
* Camera length: 35–2300 mm
* EDS solid angle: 0.13 srad
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== Related Instrumentation in the KNI ==
===== Transmission Electron Microscopes =====
* [[Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF | Tecnai TF-30: TEM, STEM, EDS & HAADF (50-300 kV)]]
* [[Tecnai TF-20: 200 kV TEM, STEM, EDS, EELS, EFTEM & Lithography | Tecnai TF-20: TEM, STEM, EDS, EELS, EFTEM & Lithography (40-200 kV)]]
===== Sample Preparation for TEM =====
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe]]
* [[TEM Sample Preparation Equipment | TEM Sample Preparation Equipment: Polishing Stations, 3 mm Disk Cutter, Dimpler, Argon Ion Mill]]
===== Scanning Electron Microscopes (SEMs) =====
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe]]
* [[Nova 200 NanoLab: SEM, EDS & WDS | Nova 200 NanoLab: SEM, EDS & WDS]]
* [[Sirion: SEM & EDS | Sirion: SEM & EDS]]
* [[Quanta 200F: SEM, ESEM, Lithography & Probe Station | Quanta 200F: SEM, ESEM, Lithography & Probe Station]]
===== Focused Ion Beam (FIB) Systems =====
* [[Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe|Nova 600 NanoLab: SEM, Ga-FIB, GIS & Omniprobe]]
* [[ORION NanoFab: Helium, Neon & Gallium FIB | ORION NanoFab: Helium, Neon & Gallium FIB]]
===== Sample Preparation for Microscopy =====
* [[Carbon Evaporator | Carbon Evaporator (Leica EM ACE600) to make samples conductive]]
* [[Tergeo Plus ICP- & CCP-RIE: Oxygen & Argon Plasma Cleaner | Oxygen & Argon Plasma Cleaner (Tergeo Plus ICP- & CCP-RIE) to remove hydrocarbons from surface]]