View source for Dektak 3ST: Profilometer

{{InstrumentInfoboxOneImage|
|InstrumentName = Veeco Dektak 3ST Profilometer
|HeaderColor = #F5A81C
|ImageOne = Dektak-3ST-Profilometer.jpg
|ImageTwo = 
|InstrumentType = [[Equipment_List#Metrology|Metrology]]
|RoomLocation = B235 Steele
|LabPhone = 626-395-1539
|PrimaryStaff = [[Alireza Ghaffari]]
|StaffEmail = alireza@caltech.edu
|StaffPhone = 626-395-3984
|Manufacturer = Veeco
|Model = Dektak 3ST
|Techniques = Surface Profiling
|RequestTraining = alireza@caltech.edu
|EmailList = kni-metrology
|EmailListName = Metrology
}}
== Description ==
The Dektak 3ST profilometer is a stylus-type surface profiler. It is equipped with a camera for locating the region of interest, manual sample manipulation & tilt correction, and profile analysis software. It can be used to get a rough idea of the topography of features by scanning a single line across the surface. Features as small as 100 nm in height can be determined with some approximation. 

===== Applications =====
* Surface Profiling 

== Resources ==
===== SOPs =====
* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP]
* [https://caltech.box.com/s/j6br8jpkr7ov0k9dwx7wzyzt9f5fj3rt Dektak Operations Manual]
<br>
<br>

== Related Instrumentation in the KNI ==
===== Scanning Probe Microscopes =====
* [[Dimension Icon: Atomic Force Microscope (AFM) | Dimension Icon: Atomic Force Microscope (AFM)]]
* [[Dektak 3ST: Profilometer | Dektak 3ST: Profilometer]]