Profilometer: Keyence VK-X3000

From the KNI Lab at Caltech
Revision as of 23:12, 7 January 2026 by Tkimoto (talk | contribs) (Created page with "{{InstrumentInfoboxOneImage| |InstrumentName = Keyence VK-X3000 Profilometer |HeaderColor = #F5A81C |ImageOne = Dektak-3ST-Profilometer.jpg |ImageTwo = |InstrumentType = Metrology |RoomLocation = B235 Steele |LabPhone = 626-395-1539 |PrimaryStaff = Yonghwi Kim |StaffEmail = ykim@caltech.edu |StaffPhone = 626-395-5994 |Manufacturer = Keyence |Model = VK-X3000 |Techniques = Surface Profiling }} == Description == The Keyence VK-X3000 profil...")
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Keyence VK-X3000 Profilometer
Instrument Type Metrology
Techniques Surface Profiling
Staff Manager Yonghwi Kim
Staff Email ykim@caltech.edu
Staff Phone 626-395-5994
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Lab Location B235 Steele
Lab Phone 626-395-1539
Manufacturer Keyence
Model VK-X3000

Description

The Keyence VK-X3000 profilometer is a stylus-type surface profiler. It is equipped with a camera for locating the region of interest, manual sample manipulation & tilt correction, and profile analysis software. It can be used to get a rough idea of the topography of features by scanning a single line across the surface. Features as small as 100 nm in height can be determined with some approximation.

Applications
  • Surface Profiling

Resources

SOPs



Related Instrumentation in the KNI

Scanning Probe Microscopes
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