The J.A. Woolam M-2000 spectroscopic ellipsometer is a powerful tool for optical thin film analysis which enables determination of thickness, optical constants n&k (refractive index and absorption coefficient), and even allows modeling of electronic characteristics such as majority carrier concentration and band-gap. The beam incidence angle ranges from 45-90 degrees allowing both standard ellipsometry and transmission measurements. Equipped with a motorized sample stage which enables wafer-scale measurements. The CompleteEASE control and analysis software possesses detailed measurement and modeling capability.
