Profilometer: Keyence VK-X3000: Difference between revisions
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(Created page with "{{InstrumentInfoboxOneImage| |InstrumentName = Keyence VK-X3000 Profilometer |HeaderColor = #F5A81C |ImageOne = Dektak-3ST-Profilometer.jpg |ImageTwo = |InstrumentType = Metrology |RoomLocation = B235 Steele |LabPhone = 626-395-1539 |PrimaryStaff = Yonghwi Kim |StaffEmail = ykim@caltech.edu |StaffPhone = 626-395-5994 |Manufacturer = Keyence |Model = VK-X3000 |Techniques = Surface Profiling }} == Description == The Keyence VK-X3000 profil...") |
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== Description == | == Description == | ||
The Keyence VK-X3000 | The Keyence VK-X3000 is a non-contact 3D optical profilometer for surface topography and roughness measurements. It integrates three measurement principles in a single platform: white light interferometry, laser confocal scanning, and focus variation, enabling accurate 3D analysis across a wide range of materials and surface conditions. | ||
The system measures step height, surface roughness, and feature profiles without physically contacting samples, protecting delicate or sensitive materials. It provides fully automated measurements and intuitive analysis software, offering high-resolution, versatile surface characterization for research and fabrication applications. | |||
===== Applications ===== | ===== Applications ===== | ||
* | * Non-contact measurement of surface topography and roughness | ||
* Step height and feature profile characterization | |||
* Analysis of delicate or soft materials without physical contact | |||
* 3D surface mapping for research, micro- and nanoscale structures, and quality control | |||
== Resources == | == Resources == | ||
Revision as of 18:52, 8 January 2026
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Description
The Keyence VK-X3000 is a non-contact 3D optical profilometer for surface topography and roughness measurements. It integrates three measurement principles in a single platform: white light interferometry, laser confocal scanning, and focus variation, enabling accurate 3D analysis across a wide range of materials and surface conditions.
The system measures step height, surface roughness, and feature profiles without physically contacting samples, protecting delicate or sensitive materials. It provides fully automated measurements and intuitive analysis software, offering high-resolution, versatile surface characterization for research and fabrication applications.
Applications
- Non-contact measurement of surface topography and roughness
- Step height and feature profile characterization
- Analysis of delicate or soft materials without physical contact
- 3D surface mapping for research, micro- and nanoscale structures, and quality control
Resources
SOPs