Light Microscope with Spectroscopic Reflectometer

Light Microscope with Reflectometry Instrument Type Optical Characterization Techniques Optical Microscopy, Spectroscopic Reflectometry Staff Manager Bert Mendoza Staff Email bertm@caltech.edu Staff Phone 626-395-4075 Reserve time on FBS Request training via FBS User Dashboard Lab Location B217 Steele Lab Phone 626-395-1535 Manufacturer Olympus / Filmetrics Model BX51M / F40

Description

This light microscope (Olympus BX51M) can be used to observe patterns and samples optically via 5x, 10x, 50x and 100x objective lenses. It also is equipped with a spectroscopic reflectometer (Filmetrics model F40) that can measure the thickness of transparent and translucent thin films. Spectroscopic reflectometry works by comparing the spectral amplitude and periodicity of light that is reflected at normal incidence from a thin film against the light that is reflected from a known reference sample; the results are fit to a mathematical model that takes into account estimated values for n (refractive index), k (absorption coefficient), and thickness.

Applications

• Optical imaging
• Thickness determinations

Resources

SOP

• KNI SOP (Coming Soon)

Manufacturer Manuals

• Microscope Manual (Coming Soon)
• Filmetrics Manual (Coming Soon)

Specifications

• Objective Lenses: 5x, 10x, 50x, 100x
• Optical Image Modes: Bright Field, Dark Field
• Thickness Range: 20 nm to 40 μm
• Wavelength Range: 400 to 850 nm