Tecnai TF-30: 300 kV TEM, STEM, EDS & HAADF

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Tecnai TF-30
Instrument Type Microscopy
Techniques TEM, STEM,
Bright & Dark Field Imaging,
Electron Diffraction,
Staff Manager Matthew S. Hunt, PhD
Staff Email matthew.hunt@caltech.edu
Staff Phone 626-395-5994
Reserve time on LabRunr
Request training by email
Lab Location B242F Keck
Lab Phone 626-395-8908
Manufacturer FEI (now Thermo Fisher)
Model {{{Model}}}


The Nova 600 is a "dual beam" system that combines a field emission gun (FEG) scanning electron microscope (SEM) with a gallium focused ion beam (Ga-FIB). It can be used to capture high quality images (with sub-10 nm resolution) and perform site-specific etching and material deposition (with sub-50 nm resolution). It is also equipped with an Omniprobe nanomanipulator, which can be used to lift out lamella samples prepared for use in a transmission electron microscope (TEM). See a full list of training and educational resources for this instrument below.

  • High-Resolution TEM (HRTEM) imaging without an objective aperture
  • Bright Field (BF) & Dark Field (DF) imaging with an objective aperture
  • Selected Area Electron Diffraction (SAED)
  • STEM imaging with a High-Angle Annular Dark Field (HAADF) detector
  • Energy Dispersive Spectroscopy (EDS) with Oxford INCA system
  • Automatically capture tilt series of images for tomographic imaging


SOPs & Troubleshooting
Video Tutorials
Graphical Handouts
Manufacturer Manuals
Simulation Software
Order Your Own Stubs


Manufacturer Specifications
SEM Specifications
  • 0.5 to 30.0 kV
  • Apertures: 10 mm, 15 mm, 20 mmm, 30 mm
  • etc.
Ga-FIB Specifications
  • 5.0 to 30.0 kV
  • 10 pA - 20 nA
  • etc.