Equipment List: Difference between revisions
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=Lithography= | = Lithography = | ||
===== Electron Beam Lithography ===== | ===== Electron Beam Lithography ===== | ||
* Raith EBPG 5000+ (100 kV) | * Electron Beam Pattern Generator: Raith EBPG 5000+ (100 kV) | ||
* Raith EBPG 5200 (100 kV) | * Electron Beam Pattern Generator: Raith EBPG 5200 (100 kV) | ||
* Quanta 200F SEM with NPGS (1-30 kV) | * Nanometer Pattern Generation System: Quanta 200F SEM with NPGS (1-30 kV) | ||
===== Ion Beam Lithography ===== | ===== Ion Beam Lithography ===== | ||
* Zeiss ORION NanoFab (5-40 kV He & Ne, 1-30 kV Ga) | * He/Ne/Ga-FIB: Zeiss ORION NanoFab with Raith ELPHY MultiBeam Pattern Generator (5-40 kV He & Ne, 1-30 kV Ga) | ||
===== Optical Lithography ===== | |||
===== | |||
* Contact Mask Aligners: Suss Microtech models MA/BA6 & MA6/BA6 | * Contact Mask Aligners: Suss Microtech models MA/BA6 & MA6/BA6 | ||
* i-Line Wafer Stepper: GCA model 6300 | * i-Line Wafer Stepper: GCA model 6300 | ||
* Direct-Write Laser System: Heidelberg Instruments DWL-66 | * Direct-Write Laser System: Heidelberg Instruments DWL-66 | ||
* Two-Photon Lithography (3D | * Two-Photon Lithography (aka Microscale 3D Printing): Nanoscribe Photonic Professional GT | ||
= Deposition Equipment = | = Deposition Equipment = | ||
===== Evaporation ===== | ===== Evaporation ===== | ||
* | * Al, Au, Pt & Ti: Kurt J Lesker Labline | ||
* CHA Industries Mark 40 | * Metals & Oxides: CHA Industries Mark 40 | ||
* Leica EM ACE600 Carbon Evaporator | * Carbon: Leica EM ACE600 Carbon Evaporator | ||
===== Sputtering ===== | ===== Sputtering ===== | ||
* Dielectric Sputterer: AJA International ATC Orion 8 | * Dielectric Sputterer: AJA International ATC Orion 8 | ||
* Chalcogenide Sputterer: AJA International ATC Orion 5 | * Chalcogenide Sputterer: AJA International ATC Orion 5 | ||
===== Plasma- & Thermal-Enhanced Deposition ===== | ===== Plasma- & Thermal-Enhanced Deposition ===== | ||
* Atomic Layer Deposition (ALD): Oxford Instruments FlexAL II | * Atomic Layer Deposition (ALD): Oxford Instruments FlexAL II | ||
* Plasma-Enhanced Chemical Vapor Deposition (PECVD): Oxford Instruments System 100 | * Plasma-Enhanced Chemical Vapor Deposition (PECVD): Oxford Instruments System 100 | ||
* Tube Furnaces: Tystar Tytan (Wet & Dry Oxidation and Annealing) | * Tube Furnaces: Tystar Tytan (Wet & Dry Oxidation and Annealing) | ||
= Etching Equipment = | |||
===== Dry Reactive-Ion Etching (RIE) ===== | |||
* Silicon Etcher: Oxford Instruments DRIE System 100 Cryo ICP–RIE | |||
* Silicon, III/V Material & Metal Etcher: Oxford Instruments DRIE System 100 ICP–RIE | |||
* Dielectric Material Etcher: Oxford Instruments Dielectric System 100, 380 V source, ICP–RIE | |||
* Silicon, III/V Material & Organics Etcher: Plasmatherm RIE | |||
* Oxygen & Argon Plasma Cleaner: PIE Scientific Tergeo Plus ICP- & CCP-RIE | |||
===== Wet Etching ===== | |||
* Wet Chemistry | |||
= Microscopy Instrumentation = | |||
==== Focused Ion Beam (FIB) Systems ==== | |||
* He/Ne/Ga-FIB: Zeiss ORION NanoFab | |||
* SEM/Ga-FIB/Omniprobe: Thermo Fisher Nova NanoLab 600 | |||
===== Scanning Electron Microscopes (SEMs) ==== | |||
* SEM/Ga-FIB/Omniprobe: Thermo Fisher Nova NanoLab 600 | |||
* SEM/EDS/WDS: Thermo Fisher Nova NanoLab 200 | |||
* SEM/EDS: Thermo Fisher Sirion | |||
* SEM/ESEM: Thermo Fisher Quanta 200F | |||
==== Transmission Electron Microscopes (TEMs) ==== | |||
* TEM/STEM/EDS/EELS/EFTEM: Thermo Fisher Tecnai TF-20 (80-300 kV) | |||
* TEM/STEM/EDS/HAADF: Thermo Fisher Tecnai TF-30 (80-200 kV) | |||
==== Scanning Probe Microscopes ==== | |||
* Atomic Force Microscope (AFM): Bruker Dimension ICON | |||
* Profilometer: Veeco Dektak 3ST | |||
= Support Tools = | |||
==== Wafer Processing ==== |
Revision as of 23:06, 25 March 2019
Lithography
Electron Beam Lithography
- Electron Beam Pattern Generator: Raith EBPG 5000+ (100 kV)
- Electron Beam Pattern Generator: Raith EBPG 5200 (100 kV)
- Nanometer Pattern Generation System: Quanta 200F SEM with NPGS (1-30 kV)
Ion Beam Lithography
- He/Ne/Ga-FIB: Zeiss ORION NanoFab with Raith ELPHY MultiBeam Pattern Generator (5-40 kV He & Ne, 1-30 kV Ga)
Optical Lithography
- Contact Mask Aligners: Suss Microtech models MA/BA6 & MA6/BA6
- i-Line Wafer Stepper: GCA model 6300
- Direct-Write Laser System: Heidelberg Instruments DWL-66
- Two-Photon Lithography (aka Microscale 3D Printing): Nanoscribe Photonic Professional GT
Deposition Equipment
Evaporation
- Al, Au, Pt & Ti: Kurt J Lesker Labline
- Metals & Oxides: CHA Industries Mark 40
- Carbon: Leica EM ACE600 Carbon Evaporator
Sputtering
- Dielectric Sputterer: AJA International ATC Orion 8
- Chalcogenide Sputterer: AJA International ATC Orion 5
Plasma- & Thermal-Enhanced Deposition
- Atomic Layer Deposition (ALD): Oxford Instruments FlexAL II
- Plasma-Enhanced Chemical Vapor Deposition (PECVD): Oxford Instruments System 100
- Tube Furnaces: Tystar Tytan (Wet & Dry Oxidation and Annealing)
Etching Equipment
Dry Reactive-Ion Etching (RIE)
- Silicon Etcher: Oxford Instruments DRIE System 100 Cryo ICP–RIE
- Silicon, III/V Material & Metal Etcher: Oxford Instruments DRIE System 100 ICP–RIE
- Dielectric Material Etcher: Oxford Instruments Dielectric System 100, 380 V source, ICP–RIE
- Silicon, III/V Material & Organics Etcher: Plasmatherm RIE
- Oxygen & Argon Plasma Cleaner: PIE Scientific Tergeo Plus ICP- & CCP-RIE
Wet Etching
- Wet Chemistry
Microscopy Instrumentation
Focused Ion Beam (FIB) Systems
- He/Ne/Ga-FIB: Zeiss ORION NanoFab
- SEM/Ga-FIB/Omniprobe: Thermo Fisher Nova NanoLab 600
= Scanning Electron Microscopes (SEMs)
- SEM/Ga-FIB/Omniprobe: Thermo Fisher Nova NanoLab 600
- SEM/EDS/WDS: Thermo Fisher Nova NanoLab 200
- SEM/EDS: Thermo Fisher Sirion
- SEM/ESEM: Thermo Fisher Quanta 200F
Transmission Electron Microscopes (TEMs)
- TEM/STEM/EDS/EELS/EFTEM: Thermo Fisher Tecnai TF-20 (80-300 kV)
- TEM/STEM/EDS/HAADF: Thermo Fisher Tecnai TF-30 (80-200 kV)
Scanning Probe Microscopes
- Atomic Force Microscope (AFM): Bruker Dimension ICON
- Profilometer: Veeco Dektak 3ST