| Dimension Icon AFM
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| Instrument Type
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Microscopy
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| Techniques
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PeakForce Tapping Mode,
Tapping Mode, Contact Mode,
Quantitative NanoMechanics,
Piezoresponse Force Microscopy,
Magnetic Force Microscopy,
Electrostatic Force Microscopy
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| Staff Manager
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Matthew S. Hunt, PhD
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| Staff Email
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matthew.hunt@caltech.edu
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| Staff Phone
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626-395-5994
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| Lab Location
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B203B Steele
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| Lab Phone
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626-395-1545
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| Manufacturer
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Bruker
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| Model
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Dimension Icon
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Description
An AFM measures a sample's topographic and other surface information by interacting a nanoscale probe with the sample. The Dimension Icon offers three main interaction modes: (1) PeakForce Tapping Mode, which operates in conjunction with Bruker's ScanAsyst® to allow the software to automatically optimize several imaging parameters for high-quality, relatively easily-obtained images; with tapping oscillations of 0.25 to 2.0 kHz, it is also capable of capturing a force curve at each pixel in order to facilitate extraction of mechanical property data using the Quantitative NanoMechanics (QNM) software package; (2) Tapping Mode, a more traditional tapping interaction that operates near the probe cantilever's resonant frequency (usually 10s to 100s of kHz) to provide topographic and phase imaging; (3) Contact Mode, for direct, constant contact between the probe and surface, which is necessary for several other surface measurement techniques.
Applications
- Topographic imaging of surface features ranging from sub-nm to several microns in height
- Roughness measurements resulting from sub-nm Z resolution
- Phase imaging to qualitatively identify different phases of material by their surface properties
- Quantitative NanoMechanics (QNM) to extract material property data from force curves (e.g. elastic modulus, adhesion, energy dissipation)
- Piezoresponse Force Microscopy (PFM)
- Magnetic Force Microscopy (MFM) using Lift Mode
- Electrostatic Force Microscopy (EFM) using Lift Mode
- Surface Potential measurements
- Measurements in liquid environments are possible
- See Bruker's Scanning Probe Microscopy Techniques Poster
- The KNI does not currently have modules for Scanning Tunneling, TUNA & Conductive, Scanning Spreading Resistance, Scanning Capacitance, or Scanning Thermal modes; inquire with the MMRC at Caltech for access to some of these advanced techniques.
Resources
SOPs & Troubleshooting
Video Tutorials
Technical Notes
Presentations
Manufacturer Manuals
Order Your Own Probes
- Probes are considered consumable items that users users are responsible for investigating and purchasing themselves. ScanAsyst-Air probes are commonly used with PeakForce Tapping Mode for topographic imaging, while the selection of Tapping Mode probes relies on a number of factors related to your sample. See Bruker's "Easy Product Wizard," for example, for some probe selection guidance.
Specifications
Manufacturer Specifications
AFM Specifications
- Minimum Feature Size Resolved, Z: ~0.1 nm
- Minimum Feature Size Resolved, X & Y: ~2 nm
- X & Y scan range: 90 μm x 90 μm
- Z scan range: up to 10 μm
- Z noise floor: <30 pm RMS in appropriate environment (imaging bandwidth up to 625 Hz)
- Z sensor noise level(closed-loop): 35 pm RMS (imaging bandwidth up to 625 Hz); 50 pm RMS force curve bandwidth (0.1 Hz to 5 kHz)
- X & Y position noise (closed-loop): ≤0.15 nm RMS (imaging bandwidth up to 625 Hz)
- X & Y position noise (open-loop): ≤0.10 nm RMS (imaging bandwidth up to 625 Hz)
- Integral nonlinearity (X-Y-Z): <0.5%
- Sample Size: ≤210 mm diameter, ≤15 mm thick
- Motorized position stage (X-Y axis): 180 mm × 150 mm inspectable area; 2 μm repeatability, unidirectional; 3 μm repeatability, bidirectional
- Microscope optics: 5-megapixel digital camera; 180 μm to 1465 μm viewing area; Digital zoom and motorized focus
