Presentations: Difference between revisions
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* Previous Helium & Neon Focused Ion Beam (He- & Ne-FIB) Microscopy: Principles, Techniques & Applications | * Previous Helium & Neon Focused Ion Beam (He- & Ne-FIB) Microscopy: Principles, Techniques & Applications | ||
** [https://caltech.box.com/s/ibe1nt5rd1u2kmvnfbjs2dj9lg28mch7 Pptx Slides] | [https://youtu.be/JXS3K8G2CVY YouTube Lecture] | ** [https://caltech.box.com/s/ibe1nt5rd1u2kmvnfbjs2dj9lg28mch7 Pptx Slides] | [https://youtu.be/JXS3K8G2CVY YouTube Lecture] | ||
===== KNI Video Tutorials ===== | ===== KNI Video Tutorials ===== | ||
* SEM: [https://youtu.be/UfF_ljwvepQ Getting Started] | [https://youtu.be/luC-5TgNPsQ Basic Alignments] | * SEM: [https://youtu.be/UfF_ljwvepQ Getting Started] | [https://youtu.be/luC-5TgNPsQ Basic Alignments] | ||
Latest revision as of 18:21, 29 June 2023
Safety Presentations
KNI Lectures
Deposition Presentations
KNI Lectures
- Sputtering: Intro to Sputtering | Dielectric Sputter System Training
- Evaporation: CHA Mk40 E-beam Evaporator Training | KJLC Labline E-beam Evaporator Training
Manufacturer Lectures
- Kurt J. Lesker Company: Intro to Vacuum Technology and Vacuum System Design | Intro to Physical Vapor Deposition and Thin Film growth
Microscopy Presentations
KNI Lectures/Masterclasses
- Sample Preparation: Principles and Best Practices
- FIB Theory (FIB): Principles, Ion Solid Interactions & their Monte Carlo Simulations
- Helium Ion Microscopy: Principles and Applications
- Scanning Electron Microscopy (SEM): Principles, Techniques & Applications
- Previous Scanning Electron Microscopy (SEM): Principles, Techniques & Applications
- Previous Gallium Focused Ion Beam (Ga-FIB) Microscopy: Principles, Techniques & Applications
- Previous Helium & Neon Focused Ion Beam (He- & Ne-FIB) Microscopy: Principles, Techniques & Applications
KNI Video Tutorials
- SEM: Getting Started | Basic Alignments
- Astigmatism Correction: Details | On Right-Angle Features | Stigmator Alignment
- Eucentric Height: What it means, When to use it & How to get there
- Ga-FIB Operation Basics
- TEM Lamella Sample Prep: Playlist
- Cutting & Imaging Cross-sections with Ga-FIB: Playlist
- Miscellaneous SEM & Ga-FIB Techniques: Playlist
- He/Ne-FIB Techniques: Playlist
- He/Ne-FIB Source Rebuild & Alignment: Playlist
- AFM Operation Basics: Playlist
Manufacturer Presentations
- Atomic Force Microscopy (AFM): Bruker's presentation on Image Quality & PeakForce Tapping
- Atomic Force Microscopy (AFM): Bruker's presentation on Quantitative NanoMechanics (QNM)