Presentations: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
|||
| Line 17: | Line 17: | ||
** [https://caltech.box.com/s/eov4kcyl9ende8zn8j10v92xpxus60sl Pptx Slides] | ** [https://caltech.box.com/s/eov4kcyl9ende8zn8j10v92xpxus60sl Pptx Slides] | ||
* FIB Theory (FIB): Principles, Ion Solid Interactions & their Monte Carlo Simulations | * FIB Theory (FIB): Principles, Ion Solid Interactions & their Monte Carlo Simulations | ||
** [https://caltech.box.com/s/r1ivh1od3noc95wzrk02wp8uo1hzv39t Pptx Slides | ** [https://caltech.box.com/s/r1ivh1od3noc95wzrk02wp8uo1hzv39t Pptx Slides] | ||
** [https://caltech.box.com/s/53687wsk7ydn5mj49ts68vofn68g329n Exercises] | |||
* Helium Ion Microscopy: Principles and Applications | * Helium Ion Microscopy: Principles and Applications | ||
** [https://caltech.box.com/s/ctfv8dv2mjptm1zsjwv257x1xeyqie1q Pptx Slides] | ** [https://caltech.box.com/s/ctfv8dv2mjptm1zsjwv257x1xeyqie1q Pptx Slides] | ||
Revision as of 18:20, 29 June 2023
Safety Presentations
KNI Lectures
Deposition Presentations
KNI Lectures
- Sputtering: Intro to Sputtering | Dielectric Sputter System Training
- Evaporation: CHA Mk40 E-beam Evaporator Training | KJLC Labline E-beam Evaporator Training
Manufacturer Lectures
- Kurt J. Lesker Company: Intro to Vacuum Technology and Vacuum System Design | Intro to Physical Vapor Deposition and Thin Film growth
Microscopy Presentations
KNI Lectures/Masterclasses
- Sample Preparation: Principles and Best Practices
- FIB Theory (FIB): Principles, Ion Solid Interactions & their Monte Carlo Simulations
- Helium Ion Microscopy: Principles and Applications
- Scanning Electron Microscopy (SEM): Principles, Techniques & Applications
- Previous Scanning Electron Microscopy (SEM): Principles, Techniques & Applications
- Previous Gallium Focused Ion Beam (Ga-FIB) Microscopy: Principles, Techniques & Applications
- Previous Helium & Neon Focused Ion Beam (He- & Ne-FIB) Microscopy: Principles, Techniques & Applications
KNI Video Tutorials
- SEM: Getting Started | Basic Alignments
- Astigmatism Correction: Details | On Right-Angle Features | Stigmator Alignment
- Eucentric Height: What it means, When to use it & How to get there
- Ga-FIB Operation Basics
- TEM Lamella Sample Prep: Playlist
- Cutting & Imaging Cross-sections with Ga-FIB: Playlist
- Miscellaneous SEM & Ga-FIB Techniques: Playlist
- He/Ne-FIB Techniques: Playlist
- He/Ne-FIB Source Rebuild & Alignment: Playlist
- AFM Operation Basics: Playlist
Manufacturer Presentations
- Atomic Force Microscopy (AFM): Bruker's presentation on Image Quality & PeakForce Tapping
- Atomic Force Microscopy (AFM): Bruker's presentation on Quantitative NanoMechanics (QNM)