Dektak 3ST: Profilometer - Revision history

Tkimoto at 21:54, 8 October 2025

2025-10-08T21:54:53Z

← Older revision		Revision as of 21:54, 8 October 2025
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	\|RoomLocation = B235 Steele		\|RoomLocation = B235 Steele
	\|LabPhone = 626-395-1539		\|LabPhone = 626-395-1539
	\|PrimaryStaff = [[~~Alireza Ghaffari~~]]		\|PrimaryStaff = [[Yonghwi Kim]]
	\|StaffEmail = ~~alireza~~@caltech.edu		\|StaffEmail = ykim@caltech.edu
	\|StaffPhone = 626-395-~~3984~~		\|StaffPhone = 626-395-5994
	\|Manufacturer = Veeco		\|Manufacturer = Veeco
	\|Model = Dektak 3ST		\|Model = Dektak 3ST

Derose: /* Resources */

2024-04-24T00:51:53Z

Resources

← Older revision		Revision as of 00:51, 24 April 2024
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	===== SOPs =====		===== SOPs =====
	* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP]		* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP]
			* [https://caltech.box.com/s/j6br8jpkr7ov0k9dwx7wzyzt9f5fj3rt Dektak Operations Manual]
	<br>		<br>
	<br>		<br>

	== Related Instrumentation in the KNI ==		== Related Instrumentation in the KNI ==
	===== Scanning Probe Microscopes =====		===== Scanning Probe Microscopes =====
	* [[Dimension Icon: Atomic Force Microscope (AFM) \| Dimension Icon: Atomic Force Microscope (AFM)]]		* [[Dimension Icon: Atomic Force Microscope (AFM) \| Dimension Icon: Atomic Force Microscope (AFM)]]
	* [[Dektak 3ST: Profilometer \| Dektak 3ST: Profilometer]]		* [[Dektak 3ST: Profilometer \| Dektak 3ST: Profilometer]]

Derose at 21:04, 12 May 2023

2023-05-12T21:04:38Z

← Older revision		Revision as of 21:04, 12 May 2023
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	\|RoomLocation = B235 Steele		\|RoomLocation = B235 Steele
	\|LabPhone = 626-395-1539		\|LabPhone = 626-395-1539
	\|PrimaryStaff = [[~~Alex Wertheim~~]]		\|PrimaryStaff = [[Alireza Ghaffari]]
	\|StaffEmail = ~~alexw~~@caltech.edu		\|StaffEmail = alireza@caltech.edu
	\|StaffPhone = 626-395-~~3371~~		\|StaffPhone = 626-395-3984
	\|Manufacturer = Veeco		\|Manufacturer = Veeco
	\|Model = Dektak 3ST		\|Model = Dektak 3ST
	\|Techniques = Surface Profiling		\|Techniques = Surface Profiling
	\|RequestTraining = ~~alexw~~@caltech.edu		\|RequestTraining = alireza@caltech.edu
	\|EmailList = kni-metrology		\|EmailList = kni-metrology
	\|EmailListName = Metrology		\|EmailListName = Metrology

Jpalmer at 21:54, 20 February 2020

2020-02-20T21:54:49Z

← Older revision		Revision as of 21:54, 20 February 2020
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	\|Techniques = Surface Profiling		\|Techniques = Surface Profiling
	\|RequestTraining = alexw@caltech.edu		\|RequestTraining = alexw@caltech.edu
	\|EmailList = kni-metrology~~@caltech.edu~~		\|EmailList = kni-metrology
	\|EmailListName = Metrology		\|EmailListName = Metrology
	}}		}}

Matthew at 22:53, 12 September 2019

2019-09-12T22:53:13Z

← Older revision		Revision as of 22:53, 12 September 2019
Line 26:		Line 26:
	===== SOPs =====		===== SOPs =====
	* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP]		* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP]
			<br>
			<br>
	== Related Instrumentation in the KNI ==		== Related Instrumentation in the KNI ==
	===== Scanning Probe Microscopes =====		===== Scanning Probe Microscopes =====
	* [[Dimension Icon: Atomic Force Microscope (AFM) \| Dimension Icon: Atomic Force Microscope (AFM)]]		* [[Dimension Icon: Atomic Force Microscope (AFM) \| Dimension Icon: Atomic Force Microscope (AFM)]]
	* [[Dektak 3ST: Profilometer \| Dektak 3ST: Profilometer]]		* [[Dektak 3ST: Profilometer \| Dektak 3ST: Profilometer]]

Matthew at 00:01, 12 September 2019

2019-09-12T00:01:57Z

← Older revision		Revision as of 00:01, 12 September 2019
Line 26:		Line 26:
	===== SOPs =====		===== SOPs =====
	* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP]		* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP]

			== Related Instrumentation in the KNI ==
			===== Scanning Probe Microscopes =====
			* [[Dimension Icon: Atomic Force Microscope (AFM) \| Dimension Icon: Atomic Force Microscope (AFM)]]
			* [[Dektak 3ST: Profilometer \| Dektak 3ST: Profilometer]]

Matthew at 21:51, 27 May 2019

2019-05-27T21:51:54Z

← Older revision		Revision as of 21:51, 27 May 2019
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	\|ImageOne = Dektak-3ST-Profilometer.jpg		\|ImageOne = Dektak-3ST-Profilometer.jpg
	\|ImageTwo =		\|ImageTwo =
	\|InstrumentType = [[Equipment_List#~~Microscopy~~\|~~Microscopy~~]]		\|InstrumentType = [[Equipment_List#Metrology\|Metrology]]
	\|RoomLocation = B235 Steele		\|RoomLocation = B235 Steele
	\|LabPhone = 626-395-1539		\|LabPhone = 626-395-1539

Matthew at 21:32, 27 May 2019

2019-05-27T21:32:40Z

← Older revision		Revision as of 21:32, 27 May 2019
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	\|ImageTwo =		\|ImageTwo =
	\|InstrumentType = [[Equipment_List#Microscopy\|Microscopy]]		\|InstrumentType = [[Equipment_List#Microscopy\|Microscopy]]
	\|RoomLocation =		\|RoomLocation = B235 Steele
	\|LabPhone = 626-395-1539		\|LabPhone = 626-395-1539
	\|PrimaryStaff = [[Alex Wertheim]]		\|PrimaryStaff = [[Alex Wertheim]]

Matthew: Created page with "{{InstrumentInfoboxOneImage| |InstrumentName = Veeco Dektak 3ST Profilometer |HeaderColor = #F5A81C |ImageOne = Dektak-3ST-Profilometer.jpg |ImageTwo = |InstrumentType = Eq..."

2019-05-27T19:08:36Z

Created page with "{{InstrumentInfoboxOneImage| |InstrumentName = Veeco Dektak 3ST Profilometer |HeaderColor = #F5A81C |ImageOne = Dektak-3ST-Profilometer.jpg |ImageTwo = |InstrumentType = Eq..."

New page

{{InstrumentInfoboxOneImage|
|InstrumentName = Veeco Dektak 3ST Profilometer
|HeaderColor = #F5A81C
|ImageOne = Dektak-3ST-Profilometer.jpg
|ImageTwo =
|InstrumentType = [[Equipment_List#Microscopy|Microscopy]]
|RoomLocation =
|LabPhone = 626-395-1539
|PrimaryStaff = [[Alex Wertheim]]
|StaffEmail = alexw@caltech.edu
|StaffPhone = 626-395-3371
|Manufacturer = Veeco
|Model = Dektak 3ST
|Techniques = Surface Profiling
|RequestTraining = alexw@caltech.edu
|EmailList = kni-metrology@caltech.edu
|EmailListName = Metrology
}}
== Description ==
The Dektak 3ST profilometer is a stylus-type surface profiler. It is equipped with a camera for locating the region of interest, manual sample manipulation & tilt correction, and profile analysis software. It can be used to get a rough idea of the topography of features by scanning a single line across the surface. Features as small as 100 nm in height can be determined with some approximation.

===== Applications =====
* Surface Profiling

== Resources ==
===== SOPs =====
* [https://caltech.box.com/s/hdic8scc882tkrcjqsbaruqph9jgo75t KNI SOP]